X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details 0.2 M ammonium sulfate and 16-22% PEG 4000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.26 α = 90
b = 88.4 β = 90
c = 126.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2015-12-06
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.98 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.28 20.03 96.7 -- 0.1 -- 4.7 -- 27522 -- -- 34.61
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.28 2.36 91.8 0.49 -- -- 4.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.28 20.03 -- 1.35 -- 27513 2000 96.6 -- 0.188 0.184 0.239 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2775 2.3344 -- 131 1679 0.229 0.3212 -- 89.0
X Ray Diffraction 2.3344 2.3974 -- 141 1793 0.2272 0.3173 -- 98.0
X Ray Diffraction 2.3974 2.4678 -- 143 1830 0.2111 0.2762 -- 98.0
X Ray Diffraction 2.4678 2.5473 -- 141 1793 0.2072 0.2791 -- 97.0
X Ray Diffraction 2.5473 2.6382 -- 140 1786 0.2113 0.2711 -- 96.0
X Ray Diffraction 2.6382 2.7436 -- 144 1835 0.2063 0.2971 -- 98.0
X Ray Diffraction 2.7436 2.8681 -- 146 1861 0.2086 0.2485 -- 99.0
X Ray Diffraction 2.8681 3.0188 -- 146 1861 0.2096 0.3049 -- 100.0
X Ray Diffraction 3.0188 3.2072 -- 146 1874 0.2008 0.2565 -- 100.0
X Ray Diffraction 3.2072 3.4537 -- 147 1868 0.1965 0.2528 -- 100.0
X Ray Diffraction 3.4537 3.7991 -- 120 1522 0.1966 0.2415 -- 80.0
X Ray Diffraction 3.7991 4.344 -- 148 1889 0.1595 0.2031 -- 99.0
X Ray Diffraction 4.344 5.4546 -- 151 1937 0.1485 0.1954 -- 99.0
X Ray Diffraction 5.4546 20.0324 -- 156 1985 0.1597 0.1946 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.004
f_chiral_restr 0.032
f_angle_d 0.844
f_dihedral_angle_d 14.92
f_plane_restr 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4503
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 176

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing