X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 298.0
Details 10% PEG 4000, 10% isopropanol, 0.1M HEPES

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 89.19 α = 90
b = 179.05 β = 90
c = 59.69 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2014-06-29
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9793 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.82 50 99.8 0.082 -- 56.967 10.8 -- 43031 -- -- 21.66
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.82 1.85 100.0 0.394 -- -- 11.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.822 33.181 -- 0.0 -- 42785 1989 99.2 -- 0.1823 0.1809 0.2107 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8221 1.8676 -- 135 2759 0.2151 0.2711 -- 96.0
X Ray Diffraction 1.8676 1.9181 -- 141 2850 0.2011 0.2352 -- 98.0
X Ray Diffraction 1.9181 1.9746 -- 140 2884 0.1876 0.2513 -- 99.0
X Ray Diffraction 1.9746 2.0383 -- 139 2874 0.1869 0.2405 -- 99.0
X Ray Diffraction 2.0383 2.1111 -- 141 2892 0.1851 0.2655 -- 99.0
X Ray Diffraction 2.1111 2.1956 -- 141 2901 0.1803 0.245 -- 99.0
X Ray Diffraction 2.1956 2.2955 -- 141 2909 0.1888 0.2312 -- 100.0
X Ray Diffraction 2.2955 2.4165 -- 143 2897 0.1791 0.2023 -- 100.0
X Ray Diffraction 2.4165 2.5679 -- 143 2931 0.187 0.2222 -- 100.0
X Ray Diffraction 2.5679 2.7661 -- 141 2940 0.1919 0.2036 -- 100.0
X Ray Diffraction 2.7661 3.0442 -- 144 2940 0.2053 0.2549 -- 100.0
X Ray Diffraction 3.0442 3.4843 -- 145 2963 0.1888 0.2084 -- 100.0
X Ray Diffraction 3.4843 4.3883 -- 145 2983 0.153 0.1695 -- 100.0
X Ray Diffraction 4.3883 33.1869 -- 150 3073 0.1697 0.1778 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 12.739
f_angle_d 1.729
f_plane_restr 0.008
f_chiral_restr 0.1
f_bond_d 0.019
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2817
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 362

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
HKL-2000 data scaling
PDB_EXTRACT data extraction version: 3.15
HKL-2000 data reduction
PHENIX phasing