X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 7
Temperature 293.0
Details 1.5 M Ammonium Sulfate, 0.1 M Bis-Tris Propane

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 148.31 α = 90
b = 148.31 β = 90
c = 148.31 γ = 90
Symmetry
Space Group P 43 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2013-10-30
CCD MARMOSAIC 325 mm CCD -- 2012-05-08
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.984 SSRL BL9-2
SYNCHROTRON APS BEAMLINE 19-ID 0.979 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.56 50 100.0 0.18 -- -- 42.8 -- 18572 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.56 2.6 100.0 1.0 -- 4.17 43.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.561 35.971 -- 1.34 -- 18514 1851 99.98 -- 0.2091 0.2076 0.2229 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5613 2.6528 -- 181 1627 0.2677 0.2788 -- 100.0
X Ray Diffraction 2.6528 2.759 -- 180 1621 0.2534 0.2624 -- 100.0
X Ray Diffraction 2.759 2.8845 -- 181 1632 0.2531 0.2829 -- 100.0
X Ray Diffraction 2.8845 3.0365 -- 181 1633 0.264 0.2945 -- 100.0
X Ray Diffraction 3.0365 3.2267 -- 183 1647 0.2493 0.2572 -- 100.0
X Ray Diffraction 3.2267 3.4756 -- 182 1641 0.2388 0.2322 -- 100.0
X Ray Diffraction 3.4756 3.825 -- 186 1661 0.2099 0.2392 -- 100.0
X Ray Diffraction 3.825 4.3777 -- 185 1675 0.1638 0.1952 -- 100.0
X Ray Diffraction 4.3777 5.5122 -- 190 1711 0.1721 0.1721 -- 100.0
X Ray Diffraction 5.5122 35.9747 -- 202 1815 0.2062 0.2189 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.055
f_dihedral_angle_d 17.027
f_angle_d 1.355
f_plane_restr 0.005
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1259
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 76

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing