X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.3
Temperature 294.0
Details 0.1 M MES (pH 6.3), 10 % PEG 20000, 10 % (v/v) ethylene glycol, 0.2 M potassium thiocyanate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.79 α = 90
b = 101.7 β = 90
c = 193.8 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2013-01-23
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 0.9791 SSRL BL12-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 50 98.2 -- -- -- 16.2 -- 30966 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.8 49.185 -- 1.35 -- 30817 1544 99.73 -- 0.2113 0.2092 0.2507 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8 2.8904 -- 137 2557 0.3077 0.376 -- 98.0
X Ray Diffraction 2.8904 2.9937 -- 138 2638 0.2422 0.3146 -- 100.0
X Ray Diffraction 2.9937 3.1135 -- 133 2619 0.2371 0.3296 -- 100.0
X Ray Diffraction 3.1135 3.2552 -- 142 2623 0.2444 0.2949 -- 100.0
X Ray Diffraction 3.2552 3.4268 -- 130 2648 0.2195 0.2782 -- 100.0
X Ray Diffraction 3.4268 3.6414 -- 131 2667 0.2083 0.2342 -- 100.0
X Ray Diffraction 3.6414 3.9224 -- 135 2645 0.211 0.2386 -- 100.0
X Ray Diffraction 3.9224 4.317 -- 132 2658 0.1913 0.2619 -- 100.0
X Ray Diffraction 4.317 4.9411 -- 145 2683 0.1758 0.2121 -- 100.0
X Ray Diffraction 4.9411 6.2233 -- 153 2717 0.2247 0.2673 -- 100.0
X Ray Diffraction 6.2233 49.1927 -- 168 2818 0.1966 0.2199 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_angle_d 0.555
f_bond_d 0.003
f_dihedral_angle_d 12.002
f_chiral_restr 0.028
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8564
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 48

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10.1_2155: ???)
XDS data reduction
XDS data scaling
PHASER phasing
Coot model building