X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Details 75MM AMMONIUM IODIDE, 3.5% PEG 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 68.89 α = 75.03
b = 83.31 β = 76.2
c = 127.38 γ = 68.5
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 -- ESRF ID14-4

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 47.8 97.2 0.11 -- -- 2.0 -- 84531 -- 1.5 60.63
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.55 96.3 0.39 -- 1.0 1.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 42.356 -- 1.96 -- 75190 2249 97.29 -- 0.1989 0.198 0.2295 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6565 -- 132 4511 0.3054 0.3191 -- 96.0
X Ray Diffraction 2.6565 2.7183 -- 144 4493 0.3041 0.3616 -- 96.0
X Ray Diffraction 2.7183 2.7863 -- 140 4546 0.2698 0.3259 -- 97.0
X Ray Diffraction 2.7863 2.8616 -- 136 4557 0.2546 0.3007 -- 97.0
X Ray Diffraction 2.8616 2.9458 -- 142 4507 0.242 0.3171 -- 97.0
X Ray Diffraction 2.9458 3.0408 -- 151 4532 0.242 0.3028 -- 97.0
X Ray Diffraction 3.0408 3.1495 -- 132 4616 0.2305 0.2883 -- 98.0
X Ray Diffraction 3.1495 3.2755 -- 141 4546 0.2149 0.2686 -- 98.0
X Ray Diffraction 3.2755 3.4246 -- 111 4626 0.2035 0.2566 -- 98.0
X Ray Diffraction 3.4246 3.605 -- 153 4605 0.1991 0.223 -- 98.0
X Ray Diffraction 3.605 3.8308 -- 141 4530 0.1906 0.224 -- 98.0
X Ray Diffraction 3.8308 4.1263 -- 133 4575 0.1877 0.2219 -- 98.0
X Ray Diffraction 4.1263 4.5411 -- 148 4604 0.1625 0.2056 -- 98.0
X Ray Diffraction 4.5411 5.1972 -- 155 4550 0.156 0.1867 -- 98.0
X Ray Diffraction 5.1972 6.544 -- 149 4553 0.1977 0.1909 -- 98.0
X Ray Diffraction 6.544 42.362 -- 141 4590 0.1886 0.21 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 80.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 18.734
f_bond_d 0.005
f_angle_d 0.879
f_chiral_restr 0.061
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14003
Nucleic Acid Atoms 0
Heterogen Atoms 235
Solvent Atoms 207

Software

Software
Software Name Purpose
PHENIX refinement version: (PHENIX.REFINE)
XDS data reduction
Aimless data scaling
PHASER phasing