X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 277.0
Details 25 mM HEPES (pH 7.5), PEG20000 (12% 18%) and 2% (w/v) Benzamidine hydrochloride

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 79.61 α = 90
b = 53.23 β = 100.11
c = 127.66 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2012-07-20
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97907 NSLS X4C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 37.86 98.2 -- 0.093 -- 6.6 -- 15981 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.64 93.5 0.256 -- 5.9 4.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.606 37.859 -- 1.34 -- 15973 1597 97.7 -- 0.1907 0.1854 0.2373 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6055 2.6896 -- 133 1200 0.2385 0.3098 -- 90.0
X Ray Diffraction 2.6896 2.7857 -- 145 1298 0.2419 0.3084 -- 97.0
X Ray Diffraction 2.7857 2.8972 -- 139 1256 0.2452 0.3098 -- 96.0
X Ray Diffraction 2.8972 3.029 -- 143 1291 0.238 0.338 -- 96.0
X Ray Diffraction 3.029 3.1886 -- 146 1302 0.2266 0.2724 -- 97.0
X Ray Diffraction 3.1886 3.3883 -- 143 1290 0.2056 0.2754 -- 98.0
X Ray Diffraction 3.3883 3.6497 -- 148 1327 0.19 0.2501 -- 99.0
X Ray Diffraction 3.6497 4.0166 -- 148 1338 0.1628 0.2296 -- 100.0
X Ray Diffraction 4.0166 4.5969 -- 148 1326 0.1423 0.1724 -- 100.0
X Ray Diffraction 4.5969 5.7883 -- 151 1365 0.1572 0.1949 -- 100.0
X Ray Diffraction 5.7883 37.8632 -- 153 1383 0.1532 0.1806 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 13.704
f_chiral_restr 0.044
f_plane_restr 0.005
f_bond_d 0.009
f_angle_d 1.21
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3326
Nucleic Acid Atoms 0
Heterogen Atoms 33
Solvent Atoms 55

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing