X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.5
Temperature 297.0
Details 2.0 M ammonium sulfate, 0.1 M acetate acid, pH 4.5, and 2.67% acetonitrile

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 36.38 α = 90
b = 91.66 β = 90
c = 141.8 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2013-02-08
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.979 NSLS X4C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.57 38.49 99.8 0.044 -- -- 6.6 7908 7908 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.57 2.61 98.0 0.12 -- 16.2 4.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.57 38.489 -- 1.34 -- 7908 363 99.82 -- 0.2215 0.2187 0.264 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5694 2.9411 -- 114 2448 0.2862 0.3521 -- 100.0
X Ray Diffraction 2.9411 3.705 -- 129 2479 0.2287 0.3128 -- 100.0
X Ray Diffraction 3.705 38.4934 -- 120 2618 0.1907 0.2034 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_angle_d 0.746
f_dihedral_angle_d 14.599
f_bond_d 0.003
f_chiral_restr 0.049
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1838
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 48

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.1_1168
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing