X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 298.0
Details 0.1 M HEPES pH 7.5, 7 uM spermine, 15% PEG 8000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 39.19 α = 90
b = 97.04 β = 90
c = 103.33 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2014-07-17
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 50 98.1 -- -- -- 6.3 -- 19106 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.33 84.9 -- -- 2.9 2.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.25 32.459 -- 1.36 -- 19089 1918 97.56 -- 0.2058 0.2035 0.2274 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2443 2.3004 -- 104 966 0.2905 0.3419 -- 77.0
X Ray Diffraction 2.3004 2.3626 -- 121 1133 0.2585 0.3031 -- 93.0
X Ray Diffraction 2.3626 2.4321 -- 148 1189 0.2402 0.2824 -- 98.0
X Ray Diffraction 2.4321 2.5105 -- 128 1223 0.2451 0.2812 -- 99.0
X Ray Diffraction 2.5105 2.6002 -- 141 1253 0.2352 0.2573 -- 100.0
X Ray Diffraction 2.6002 2.7043 -- 135 1227 0.2267 0.2552 -- 100.0
X Ray Diffraction 2.7043 2.8273 -- 140 1259 0.2334 0.2794 -- 100.0
X Ray Diffraction 2.8273 2.9763 -- 137 1232 0.2377 0.2543 -- 100.0
X Ray Diffraction 2.9763 3.1626 -- 145 1229 0.2277 0.2374 -- 100.0
X Ray Diffraction 3.1626 3.4065 -- 138 1250 0.2192 0.2434 -- 99.0
X Ray Diffraction 3.4065 3.7489 -- 144 1266 0.211 0.2336 -- 100.0
X Ray Diffraction 3.7489 4.2903 -- 144 1283 0.186 0.2324 -- 100.0
X Ray Diffraction 4.2903 5.4013 -- 142 1295 0.1764 0.1908 -- 100.0
X Ray Diffraction 5.4013 32.4626 -- 151 1366 0.1619 0.1715 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.004
f_chiral_restr 0.031
f_dihedral_angle_d 22.036
f_angle_d 0.715
f_plane_restr 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1127
Nucleic Acid Atoms 650
Heterogen Atoms 4
Solvent Atoms 75

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
SERGUI data collection
HKL-2000 data scaling
PHENIX phasing