X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.3
Temperature 294.0
Details 15% PEG 3350, 0.05M MgCl2, 0.067M NaCl, 0.1M Tris

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.05 α = 90
b = 82.83 β = 110.53
c = 58.9 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2013-07-27
Diffraction Radiation
Monochromator Protocol
Side scattering bent cube i-beam single crystal asymmetric cut 4.965 degs SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 1.0 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 46.71 98.8 0.07 -- -- 6.5 -- 21983 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.295 2.38 98.69 0.36 -- 1.8 6.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.295 46.713 -- 0.0 -- 20650 1892 92.81 -- 0.2105 0.2067 0.2475 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2946 2.352 -- 115 1097 0.3002 0.3522 -- 77.0
X Ray Diffraction 2.352 2.4156 -- 126 1210 0.2788 0.3 -- 83.0
X Ray Diffraction 2.4156 2.4867 -- 111 1252 0.2528 0.3296 -- 87.0
X Ray Diffraction 2.4867 2.5669 -- 150 1266 0.2563 0.2982 -- 89.0
X Ray Diffraction 2.5669 2.6587 -- 123 1303 0.2397 0.2798 -- 91.0
X Ray Diffraction 2.6587 2.7651 -- 130 1361 0.2579 0.2812 -- 93.0
X Ray Diffraction 2.7651 2.8909 -- 141 1305 0.2587 0.2936 -- 92.0
X Ray Diffraction 2.8909 3.0433 -- 143 1373 0.2408 0.2884 -- 96.0
X Ray Diffraction 3.0433 3.2339 -- 126 1447 0.2536 0.2765 -- 99.0
X Ray Diffraction 3.2339 3.4836 -- 145 1422 0.2272 0.2749 -- 98.0
X Ray Diffraction 3.4836 3.834 -- 140 1427 0.2074 0.2481 -- 98.0
X Ray Diffraction 3.834 4.3884 -- 144 1390 0.1811 0.2186 -- 97.0
X Ray Diffraction 4.3884 5.5275 -- 153 1465 0.1744 0.2056 -- 100.0
X Ray Diffraction 5.5275 46.7222 -- 145 1440 0.172 0.2266 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.025
f_bond_d 0.003
f_dihedral_angle_d 14.476
f_plane_restr 0.002
f_angle_d 0.646
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3751
Nucleic Acid Atoms 0
Heterogen Atoms 46
Solvent Atoms 33

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1690
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing