X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 7.5
Temperature 293.0
Details Crystals grown in a reservoir solution of 23% PEG 8000 and 0.1M HEPES pH 7.5 and flash frozen in liquid nitrogen with 20% PEG 400 as a cryoprotectant

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.02 α = 90
b = 77.03 β = 90
c = 85.23 γ = 90
Symmetry
Space Group P 21 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2014-11-26
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 42.61 90.8 0.114 -- 11.969 5.3 -- 33667 -- -- 24.79
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.97 2.04 50.4 0.329 -- -- 1.6 1841

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.954 42.614 -- 1.35 -- 33622 1684 89.78 -- 0.1716 0.1693 0.2146 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9537 2.0112 -- 66 1148 0.245 0.2542 -- 40.0
X Ray Diffraction 2.0112 2.0761 -- 95 1873 0.2183 0.2845 -- 64.0
X Ray Diffraction 2.0761 2.1503 -- 120 2354 0.2073 0.267 -- 81.0
X Ray Diffraction 2.1503 2.2364 -- 147 2711 0.1976 0.2454 -- 93.0
X Ray Diffraction 2.2364 2.3382 -- 154 2910 0.178 0.2366 -- 99.0
X Ray Diffraction 2.3382 2.4614 -- 154 2931 0.1758 0.2316 -- 100.0
X Ray Diffraction 2.4614 2.6156 -- 155 2927 0.1688 0.225 -- 100.0
X Ray Diffraction 2.6156 2.8176 -- 154 2960 0.1692 0.1986 -- 100.0
X Ray Diffraction 2.8176 3.101 -- 154 2984 0.174 0.2175 -- 100.0
X Ray Diffraction 3.101 3.5496 -- 159 2971 0.1594 0.1969 -- 100.0
X Ray Diffraction 3.5496 4.4713 -- 159 3021 0.1433 0.1843 -- 100.0
X Ray Diffraction 4.4713 42.6236 -- 167 3148 0.169 0.2171 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 33.7624
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.055
f_plane_restr 0.006
f_bond_d 0.007
f_angle_d 0.889
f_dihedral_angle_d 11.607
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3484
Nucleic Acid Atoms 0
Heterogen Atoms 72
Solvent Atoms 333

Software

Software
Software Name Purpose
HKL-2000 data scaling
PHENIX refinement version: 1.10_2155
PDB_EXTRACT data extraction version: 3.15
HKL-2000 data reduction
PHENIX phasing