X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 293.0
Details 0.1 M Bis-Tris pH 6.5, 20% PEG 1500

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.35 α = 90
b = 77.43 β = 90
c = 138.42 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2014-05-12
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 17.7 99.5 -- 0.219 -- 8.2 -- 33258 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 17.7 -- 1.35 -- 33163 2000 99.44 -- 0.2018 0.1981 0.2605 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 1.9475 -- 138 2152 0.388 0.4301 -- 98.0
X Ray Diffraction 1.9475 2.0001 -- 140 2164 0.2648 0.3095 -- 99.0
X Ray Diffraction 2.0001 2.0588 -- 139 2179 0.2184 0.2742 -- 99.0
X Ray Diffraction 2.0588 2.1252 -- 141 2199 0.2265 0.2814 -- 99.0
X Ray Diffraction 2.1252 2.201 -- 141 2199 0.2094 0.2893 -- 99.0
X Ray Diffraction 2.201 2.289 -- 138 2151 0.3241 0.4857 -- 98.0
X Ray Diffraction 2.289 2.3929 -- 144 2232 0.2158 0.297 -- 100.0
X Ray Diffraction 2.3929 2.5187 -- 141 2213 0.2174 0.3068 -- 100.0
X Ray Diffraction 2.5187 2.676 -- 143 2220 0.2071 0.2645 -- 100.0
X Ray Diffraction 2.676 2.8818 -- 144 2246 0.1913 0.2798 -- 100.0
X Ray Diffraction 2.8818 3.1703 -- 144 2238 0.1942 0.2495 -- 100.0
X Ray Diffraction 3.1703 3.6257 -- 145 2268 0.1664 0.2373 -- 100.0
X Ray Diffraction 3.6257 4.5551 -- 147 2289 0.152 0.1969 -- 100.0
X Ray Diffraction 4.5551 17.7075 -- 155 2413 0.1473 0.1768 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.11
f_chiral_restr 0.041
f_bond_d 0.007
f_dihedral_angle_d 13.318
f_plane_restr 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3324
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 413

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
MOSFLM data reduction
PHENIX phasing