X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 277.0
Details 50mM TRIS, 17% PEG 350 MME, 2% NG, 10mM spermidine, 10mM MgCl2, 10mM AMP-PNP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 90.07 α = 84.67
b = 97.26 β = 64.78
c = 105.45 γ = 62.59
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2015-01-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-1 0.972423 ESRF ID23-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 44 94.4 0.026 -- -- 1.8 -- 40590 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.3 3.4 94.4 0.867 -- 0.5 1.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.303 43.862 -- 1.94 -- 33718 1708 78.83 -- 0.2523 0.2504 0.2892 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.3028 3.3999 -- 14 301 0.4219 0.3837 -- 9.0
X Ray Diffraction 3.3999 3.5096 -- 46 923 0.388 0.4453 -- 27.0
X Ray Diffraction 3.5096 3.635 -- 122 2185 0.3506 0.3844 -- 65.0
X Ray Diffraction 3.635 3.7805 -- 179 3153 0.3209 0.3592 -- 93.0
X Ray Diffraction 3.7805 3.9524 -- 165 3235 0.3058 0.3459 -- 96.0
X Ray Diffraction 3.9524 4.1606 -- 175 3256 0.2874 0.3528 -- 96.0
X Ray Diffraction 4.1606 4.4211 -- 153 3258 0.2571 0.2629 -- 94.0
X Ray Diffraction 4.4211 4.7621 -- 189 3105 0.2354 0.275 -- 94.0
X Ray Diffraction 4.7621 5.2406 -- 170 3204 0.239 0.2767 -- 94.0
X Ray Diffraction 5.2406 5.9973 -- 160 3179 0.2749 0.317 -- 94.0
X Ray Diffraction 5.9973 7.5497 -- 175 3160 0.277 0.3249 -- 93.0
X Ray Diffraction 7.5497 43.8659 -- 160 3051 0.202 0.233 -- 91.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.404
f_plane_restr 0.005
f_bond_d 0.006
f_dihedral_angle_d 18.073
f_chiral_restr 0.052
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 15430
Nucleic Acid Atoms 0
Heterogen Atoms 124
Solvent Atoms 0

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
XDS data reduction
XSCALE data scaling
PHASER phasing