X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 273.0
Details 40 % MPD, 0.1 M Tris pH 8.00

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 83.69 α = 90
b = 56.85 β = 90
c = 62.46 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2012-12-21
Diffraction Radiation
Monochromator Protocol
double crystal MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 37.57 99.8 0.098 -- -- 7.0 -- 33513 2.0 -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.73 100.0 0.669 -- -- 6.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.7 37.569 -- 1.09 -- 31765 3203 99.51 -- 0.1471 0.1458 0.1722 Random Selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6979 1.7233 -- 143 2472 0.221 0.2568 -- 93.0
X Ray Diffraction 1.7233 1.7502 -- 138 2614 0.2072 0.2361 -- 100.0
X Ray Diffraction 1.7502 1.7789 -- 135 2634 0.1883 0.2356 -- 100.0
X Ray Diffraction 1.7789 1.8096 -- 145 2587 0.1762 0.2307 -- 100.0
X Ray Diffraction 1.8096 1.8425 -- 146 2631 0.1628 0.1879 -- 100.0
X Ray Diffraction 1.8425 1.8779 -- 154 2604 0.156 0.1721 -- 100.0
X Ray Diffraction 1.8779 1.9162 -- 128 2642 0.1534 0.1763 -- 100.0
X Ray Diffraction 1.9162 1.9579 -- 123 2661 0.1406 0.1655 -- 100.0
X Ray Diffraction 1.9579 2.0034 -- 166 2577 0.1345 0.1897 -- 100.0
X Ray Diffraction 2.0034 2.0535 -- 131 2634 0.1309 0.1572 -- 100.0
X Ray Diffraction 2.0535 2.109 -- 137 2650 0.1294 0.128 -- 100.0
X Ray Diffraction 2.109 2.1711 -- 150 2601 0.1287 0.1414 -- 100.0
X Ray Diffraction 2.1711 2.2412 -- 130 2641 0.1279 0.1791 -- 100.0
X Ray Diffraction 2.2412 2.3213 -- 150 2596 0.1287 0.1752 -- 100.0
X Ray Diffraction 2.3213 2.4142 -- 162 2615 0.1368 0.1563 -- 100.0
X Ray Diffraction 2.4142 2.524 -- 135 2639 0.1374 0.1843 -- 100.0
X Ray Diffraction 2.524 2.6571 -- 135 2603 0.1373 0.152 -- 100.0
X Ray Diffraction 2.6571 2.8235 -- 136 2659 0.1423 0.1933 -- 100.0
X Ray Diffraction 2.8235 3.0414 -- 150 2576 0.1524 0.2126 -- 100.0
X Ray Diffraction 3.0414 3.3473 -- 161 2609 0.1536 0.1629 -- 100.0
X Ray Diffraction 3.3473 3.8313 -- 149 2617 0.1285 0.1588 -- 100.0
X Ray Diffraction 3.8313 4.8254 -- 118 2633 0.1259 0.133 -- 100.0
X Ray Diffraction 4.8254 37.5786 -- 81 2604 0.1848 0.1935 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 13.222
f_angle_d 1.268
f_plane_restr 0.007
f_bond_d 0.009
f_chiral_restr 0.051
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2182
Nucleic Acid Atoms 0
Heterogen Atoms 23
Solvent Atoms 278

Software

Software
Software Name Purpose
PHENIX refinement version: dev_1888
HKL-3000 data reduction
HKL-3000 data scaling
HKL-3000 phasing