X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 0.1 M HEPES, 20% PEG 8000, and 4% ethylene glycol

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 176.72 α = 90
b = 39.12 β = 101.1
c = 132.1 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2013-02-18
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 94.2 -- -- -- 3.3 -- 36884 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.302 32.407 -- 1.33 -- 36667 1945 91.42 -- 0.2464 0.2446 0.2791 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3021 2.3596 -- 103 1821 0.4516 0.4601 -- 69.0
X Ray Diffraction 2.3596 2.4234 -- 124 2215 0.4341 0.4286 -- 82.0
X Ray Diffraction 2.4234 2.4947 -- 131 2294 0.423 0.4673 -- 86.0
X Ray Diffraction 2.4947 2.5752 -- 136 2432 0.4104 0.3948 -- 91.0
X Ray Diffraction 2.5752 2.6672 -- 145 2565 0.3991 0.5191 -- 95.0
X Ray Diffraction 2.6672 2.7739 -- 147 2622 0.3715 0.4039 -- 97.0
X Ray Diffraction 2.7739 2.9001 -- 145 2602 0.3565 0.3215 -- 97.0
X Ray Diffraction 2.9001 3.0529 -- 149 2650 0.3357 0.3776 -- 98.0
X Ray Diffraction 3.0529 3.244 -- 146 2589 0.3018 0.3489 -- 95.0
X Ray Diffraction 3.244 3.4942 -- 138 2541 0.2603 0.2654 -- 94.0
X Ray Diffraction 3.4942 3.8453 -- 145 2582 0.2287 0.2646 -- 95.0
X Ray Diffraction 3.8453 4.4005 -- 146 2614 0.1874 0.2355 -- 95.0
X Ray Diffraction 4.4005 5.5397 -- 149 2671 0.1748 0.2377 -- 96.0
X Ray Diffraction 5.5397 32.4101 -- 141 2524 0.1535 0.1688 -- 88.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.058
f_plane_restr 0.009
f_angle_d 1.409
f_dihedral_angle_d 24.563
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2268
Nucleic Acid Atoms 1460
Heterogen Atoms 8
Solvent Atoms 20

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
SERGUI data collection
HKL-2000 data reduction
PHASER phasing