X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 293.0
Details 0.2M Potassium iodide, 2.2M Ammonium Sulfate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.62 α = 90
b = 43.63 β = 90.04
c = 52.67 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M-F -- 2014-06-12
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.15 41.62 79.13 0.06794 -- -- 2.9 -- 53751 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.146 1.187 12.95 -- -- -- 1.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.146 41.62 -- 1.05 -- 53749 3521 69.83 -- 0.1537 0.1531 0.1683 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.1456 1.1613 -- 4 162 0.4376 0.5061 -- 3.0
X Ray Diffraction 1.1613 1.1779 -- 24 379 0.355 0.4235 -- 7.0
X Ray Diffraction 1.1779 1.1954 -- 17 747 0.3235 0.4497 -- 14.0
X Ray Diffraction 1.1954 1.2141 -- 47 1135 0.3152 0.2936 -- 22.0
X Ray Diffraction 1.2141 1.234 -- 57 1512 0.3173 0.3461 -- 30.0
X Ray Diffraction 1.234 1.2553 -- 82 1965 0.3315 0.2823 -- 38.0
X Ray Diffraction 1.2553 1.2781 -- 90 2417 0.3031 0.2757 -- 48.0
X Ray Diffraction 1.2781 1.3027 -- 116 2958 0.2851 0.3207 -- 57.0
X Ray Diffraction 1.3027 1.3293 -- 143 3431 0.2837 0.2705 -- 67.0
X Ray Diffraction 1.3293 1.3582 -- 168 4046 0.2626 0.3254 -- 78.0
X Ray Diffraction 1.3582 1.3898 -- 152 4227 0.2582 0.3439 -- 83.0
X Ray Diffraction 1.3898 1.4246 -- 178 4421 0.2357 0.3062 -- 85.0
X Ray Diffraction 1.4246 1.4631 -- 206 4345 0.2076 0.2133 -- 86.0
X Ray Diffraction 1.4631 1.5061 -- 179 4588 0.1911 0.1899 -- 89.0
X Ray Diffraction 1.5061 1.5548 -- 178 4698 0.1731 0.2306 -- 92.0
X Ray Diffraction 1.5548 1.6103 -- 195 4676 0.1558 0.175 -- 92.0
X Ray Diffraction 1.6103 1.6748 -- 165 4874 0.1417 0.1876 -- 93.0
X Ray Diffraction 1.6748 1.751 -- 216 4759 0.1273 0.1558 -- 95.0
X Ray Diffraction 1.751 1.8434 -- 164 4850 0.1289 0.1388 -- 95.0
X Ray Diffraction 1.8434 1.9588 -- 196 4969 0.1222 0.1281 -- 95.0
X Ray Diffraction 1.9588 2.1101 -- 191 4854 0.1115 0.1628 -- 95.0
X Ray Diffraction 2.1101 2.3224 -- 193 4816 0.1121 0.0967 -- 94.0
X Ray Diffraction 2.3224 2.6584 -- 190 4877 0.1282 0.1387 -- 95.0
X Ray Diffraction 2.6584 3.3491 -- 190 4934 0.1316 0.1492 -- 95.0
X Ray Diffraction 3.3491 41.6475 -- 180 4873 0.1509 0.1522 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.014
f_dihedral_angle_d 12.08
f_angle_d 1.593
f_chiral_restr 0.189
f_plane_restr 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1512
Nucleic Acid Atoms 0
Heterogen Atoms 96
Solvent Atoms 172

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
XDS data reduction
XDS data scaling
PHENIX model building
PHASER phasing