X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.6
Temperature 293.0
Details Sodium chloride, ethylene imine polymer, citrate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.99 α = 90
b = 77.99 β = 90
c = 77.99 γ = 90
Symmetry
Space Group I 21 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 270 -- 2014-05-20
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.9780 Photon Factory BL-17A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 39 100.0 0.124 -- -- 11.4 -- 27239 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.45 1.48 99.8 0.933 -- 2.6 11.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.45 39.0 -- 0.69 -- 27238 1454 99.97 -- 0.1696 0.1683 0.1916 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4493 1.5011 -- 138 2610 0.2336 0.2519 -- 100.0
X Ray Diffraction 1.5011 1.5612 -- 136 2586 0.2165 0.2296 -- 100.0
X Ray Diffraction 1.5612 1.6323 -- 120 2573 0.199 0.1916 -- 100.0
X Ray Diffraction 1.6323 1.7183 -- 156 2560 0.1878 0.2197 -- 100.0
X Ray Diffraction 1.7183 1.826 -- 154 2609 0.1821 0.1922 -- 100.0
X Ray Diffraction 1.826 1.967 -- 144 2556 0.1781 0.2272 -- 100.0
X Ray Diffraction 1.967 2.1649 -- 128 2610 0.1631 0.1985 -- 100.0
X Ray Diffraction 2.1649 2.4781 -- 182 2502 0.1646 0.1883 -- 100.0
X Ray Diffraction 2.4781 3.122 -- 138 2614 0.1633 0.1846 -- 100.0
X Ray Diffraction 3.122 39.0111 -- 158 2564 0.15 0.1755 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.063
f_dihedral_angle_d 22.058
f_chiral_restr 0.078
f_bond_d 0.017
f_plane_restr 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 389
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 74

Software

Software
Software Name Purpose
PHENIX refinement version: 1.10.1_2155
XDS data reduction
XDS data scaling
SHELXDE phasing