X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details 2 M ammonium sulfate, 0.1 M MES

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 46.82 α = 90
b = 62.19 β = 90
c = 88.44 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210r -- 2014-06-14
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 1 Photon Factory AR-NW12A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 37.4 98.6 -- -- -- 5.1 -- 41548 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.5 37.4 -- 1.43 -- 41514 2088 98.61 -- 0.1795 0.178 0.2077 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5001 1.535 -- 130 2522 0.262 0.2936 -- 96.0
X Ray Diffraction 1.535 1.5734 -- 145 2512 0.2325 0.2352 -- 97.0
X Ray Diffraction 1.5734 1.6159 -- 133 2583 0.2053 0.2703 -- 97.0
X Ray Diffraction 1.6159 1.6635 -- 137 2587 0.1909 0.2219 -- 98.0
X Ray Diffraction 1.6635 1.7172 -- 153 2532 0.1861 0.2465 -- 98.0
X Ray Diffraction 1.7172 1.7786 -- 119 2620 0.1818 0.2475 -- 99.0
X Ray Diffraction 1.7786 1.8498 -- 112 2620 0.1685 0.184 -- 99.0
X Ray Diffraction 1.8498 1.934 -- 143 2611 0.1691 0.218 -- 98.0
X Ray Diffraction 1.934 2.0359 -- 147 2630 0.1632 0.2392 -- 99.0
X Ray Diffraction 2.0359 2.1635 -- 126 2661 0.1613 0.2006 -- 100.0
X Ray Diffraction 2.1635 2.3305 -- 153 2627 0.1654 0.2131 -- 99.0
X Ray Diffraction 2.3305 2.5649 -- 156 2657 0.1797 0.2093 -- 100.0
X Ray Diffraction 2.5649 2.936 -- 131 2708 0.1824 0.1992 -- 100.0
X Ray Diffraction 2.936 3.6985 -- 158 2708 0.17 0.1789 -- 100.0
X Ray Diffraction 3.6985 37.4185 -- 145 2848 0.1739 0.1865 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 13.778
f_bond_d 0.007
f_plane_restr 0.005
f_angle_d 1.153
f_chiral_restr 0.079
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2229
Nucleic Acid Atoms 0
Heterogen Atoms 22
Solvent Atoms 263

Software

Software
Software Name Purpose
PHENIX refinement version: (phenix.refine: 1.8_1069)
HKL-2000 data reduction
SCALEPACK data scaling
PHENIX phasing