X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 292.0
Details 25% PEG 3500, 0.2M Ammonium Sulfate and 0.1M Tris pH 8

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.89 α = 90
b = 81.27 β = 105.99
c = 65.6 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2010-06-23
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.97946 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 50 92.4 -- -- -- 3.5 -- 5203 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 34.898 -- 1.35 -- 18181 916 92.31 -- 0.195 0.1921 0.2482 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5985 2.7355 -- 92 1737 0.2527 0.3725 -- 65.0
X Ray Diffraction 2.7355 2.9068 -- 128 2225 0.2452 0.3398 -- 84.0
X Ray Diffraction 2.9068 3.1311 -- 129 2581 0.2337 0.3099 -- 97.0
X Ray Diffraction 3.1311 3.4459 -- 155 2633 0.2183 0.2877 -- 100.0
X Ray Diffraction 3.4459 3.9439 -- 136 2680 0.1848 0.2243 -- 100.0
X Ray Diffraction 3.9439 4.9667 -- 138 2670 0.1666 0.207 -- 100.0
X Ray Diffraction 4.9667 34.9014 -- 138 2739 0.1741 0.2252 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.03
f_angle_d 0.893
f_bond_d 0.004
f_dihedral_angle_d 14.415
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4489
Nucleic Acid Atoms 0
Heterogen Atoms 59
Solvent Atoms 57

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing