X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 297.0
Details PEG8000, KCl, CaCl2

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 217.57 α = 90
b = 217.57 β = 90
c = 168.28 γ = 90
Symmetry
Space Group P 41 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2014-12-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 0.979,1.00 ALS 8.2.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 48.6 99.6 0.08 -- -- 3.1 -- 61142 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 3.299 42.67 -- 1.33 -- 60405 1991 98.82 -- -- 0.3164 0.3164 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2991 3.3816 -- 138 4028 0.4342 0.4798 -- 97.0
X Ray Diffraction 3.3816 3.473 -- 142 4159 0.4002 0.4869 -- 100.0
X Ray Diffraction 3.473 3.5751 -- 142 4166 0.3737 0.4194 -- 100.0
X Ray Diffraction 3.5751 3.6904 -- 141 4143 0.3404 0.3639 -- 100.0
X Ray Diffraction 3.6904 3.8223 -- 140 4164 0.3391 0.4137 -- 100.0
X Ray Diffraction 3.8223 3.9752 -- 139 4136 0.3102 0.3605 -- 100.0
X Ray Diffraction 3.9752 4.156 -- 143 4145 0.293 0.3209 -- 99.0
X Ray Diffraction 4.156 4.3749 -- 140 4152 0.2936 0.3455 -- 99.0
X Ray Diffraction 4.3749 4.6487 -- 144 4160 0.2753 0.3259 -- 99.0
X Ray Diffraction 4.6487 5.0071 -- 142 4180 0.2596 0.3666 -- 99.0
X Ray Diffraction 5.0071 5.51 -- 143 4199 0.2707 0.3288 -- 99.0
X Ray Diffraction 5.51 6.3051 -- 145 4250 0.2865 0.3127 -- 100.0
X Ray Diffraction 6.3051 7.9355 -- 147 4311 0.2745 0.3225 -- 100.0
X Ray Diffraction 7.9355 42.6735 -- 145 4221 0.2234 0.2459 -- 94.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.03
f_plane_restr 0.005
f_dihedral_angle_d 15.884
f_bond_d 0.005
f_angle_d 0.809
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 13627
Nucleic Acid Atoms 963
Heterogen Atoms 29
Solvent Atoms 0

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-3000 data scaling
PHENIX phasing