X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 292.15
Details 0.1 M potassium thiocyanate and 30 % (w/v) PEG monomethyl ether 2,000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.27 α = 90
b = 54.27 β = 90
c = 220.91 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-225 -- 2011-02-02
Diffraction Radiation
Monochromator Protocol
Si-111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 35 99.8 0.046 -- -- 5.7 -- 46439 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.65 1.71 99.7 0.812 -- 2.1 5.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.652 27.133 -- 1.36 -- 46436 2310 99.81 -- 0.1917 0.1896 0.2319 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6524 1.6861 -- 135 2549 0.2837 0.3157 -- 100.0
X Ray Diffraction 1.6861 1.7227 -- 132 2509 0.2555 0.3006 -- 100.0
X Ray Diffraction 1.7227 1.7628 -- 135 2564 0.2474 0.2753 -- 100.0
X Ray Diffraction 1.7628 1.8069 -- 136 2590 0.2312 0.2905 -- 100.0
X Ray Diffraction 1.8069 1.8557 -- 132 2520 0.2186 0.2749 -- 100.0
X Ray Diffraction 1.8557 1.9103 -- 135 2568 0.2012 0.241 -- 100.0
X Ray Diffraction 1.9103 1.972 -- 131 2545 0.198 0.241 -- 100.0
X Ray Diffraction 1.972 2.0424 -- 136 2580 0.1944 0.2149 -- 100.0
X Ray Diffraction 2.0424 2.1242 -- 133 2571 0.1936 0.2441 -- 100.0
X Ray Diffraction 2.1242 2.2208 -- 135 2569 0.1933 0.2004 -- 100.0
X Ray Diffraction 2.2208 2.3378 -- 137 2614 0.188 0.248 -- 100.0
X Ray Diffraction 2.3378 2.4842 -- 137 2603 0.1913 0.2478 -- 100.0
X Ray Diffraction 2.4842 2.6758 -- 136 2596 0.207 0.2577 -- 100.0
X Ray Diffraction 2.6758 2.9448 -- 137 2609 0.2088 0.2153 -- 100.0
X Ray Diffraction 2.9448 3.3703 -- 139 2657 0.187 0.2573 -- 100.0
X Ray Diffraction 3.3703 4.2436 -- 138 2649 0.1676 0.2044 -- 99.0
X Ray Diffraction 4.2436 27.1371 -- 146 2833 0.1665 0.2087 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.007
f_dihedral_angle_d 13.793
f_chiral_restr 0.04
f_angle_d 1.096
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2592
Nucleic Acid Atoms 0
Heterogen Atoms 40
Solvent Atoms 279

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1496
PHASER phasing
XDS data reduction
XSCALE data scaling