X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.3
Temperature 294.0
Details 15% PEG 3350, 0.05M MgCl2, 0.067M NaCl, 0.1M Tris

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.73 α = 90
b = 81.79 β = 111.07
c = 58.6 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2012-07-27
Diffraction Radiation
Monochromator Protocol
Side scattering bent cube i-beam single crystal asymmetric cut 4.965 degs SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.9 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 97.3 0.075 -- 38.541 6.5 -- 44183 -- -- 27.67
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.83 91.9 0.8 -- -- 5.4 2079

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.86 47.07 -- 0.0 -- 34603 1560 83.9 -- 0.2053 0.2038 0.2356 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.86 1.92 -- 69 1556 0.2357 0.2736 -- 44.0
X Ray Diffraction 1.92 1.9887 -- 92 2069 0.2426 0.2633 -- 58.0
X Ray Diffraction 1.9887 2.0683 -- 105 2561 0.2369 0.2541 -- 71.0
X Ray Diffraction 2.0683 2.1624 -- 160 3019 0.2275 0.2445 -- 85.0
X Ray Diffraction 2.1624 2.2764 -- 154 3245 0.222 0.2643 -- 92.0
X Ray Diffraction 2.2764 2.419 -- 159 3427 0.2097 0.2897 -- 95.0
X Ray Diffraction 2.419 2.6058 -- 168 3436 0.209 0.2314 -- 96.0
X Ray Diffraction 2.6058 2.868 -- 161 3465 0.2168 0.2502 -- 97.0
X Ray Diffraction 2.868 3.2829 -- 175 3530 0.2128 0.2437 -- 98.0
X Ray Diffraction 3.2829 4.1358 -- 145 3257 0.1935 0.2202 -- 91.0
X Ray Diffraction 4.1358 47.0848 -- 172 3478 0.183 0.214 -- 95.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 43.3245
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.002
f_bond_d 0.002
f_angle_d 0.596
f_dihedral_angle_d 14.146
f_chiral_restr 0.042
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3812
Nucleic Acid Atoms 0
Heterogen Atoms 64
Solvent Atoms 231

Software

Software
Software Name Purpose
HKL-2000 data scaling
PHENIX refinement
PDB_EXTRACT data extraction version: 3.15
HKL-2000 data reduction
PHENIX phasing