X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Evaporation
Details PEG3350, magnesium chloride, Bis-Tris

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.26 α = 90
b = 134.01 β = 99.65
c = 135.93 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2012-07-11
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.07816 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 90.7 0.06 0.049 -- 2.7 -- 68726 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.54 82.4 0.33 -- 2.3 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.5 29.966 -- 1.44 -- 68687 1988 90.4 -- 0.1833 0.1816 0.2395 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.5617 -- 106 4085 0.2661 0.3641 -- 78.0
X Ray Diffraction 2.5617 2.631 -- 145 4433 0.2596 0.3392 -- 84.0
X Ray Diffraction 2.631 2.7083 -- 129 4508 0.2385 0.324 -- 86.0
X Ray Diffraction 2.7083 2.7957 -- 136 4599 0.234 0.303 -- 87.0
X Ray Diffraction 2.7957 2.8955 -- 144 4724 0.2287 0.292 -- 90.0
X Ray Diffraction 2.8955 3.0114 -- 136 4742 0.2348 0.3062 -- 91.0
X Ray Diffraction 3.0114 3.1483 -- 150 4924 0.2281 0.2882 -- 93.0
X Ray Diffraction 3.1483 3.3141 -- 143 4929 0.2201 0.2646 -- 93.0
X Ray Diffraction 3.3141 3.5214 -- 146 4997 0.2102 0.3022 -- 94.0
X Ray Diffraction 3.5214 3.7928 -- 133 4221 0.1901 0.2445 -- 80.0
X Ray Diffraction 3.7928 4.1736 -- 146 4883 0.1538 0.21 -- 93.0
X Ray Diffraction 4.1736 4.7754 -- 152 5185 0.1403 0.1854 -- 98.0
X Ray Diffraction 4.7754 6.0085 -- 158 5189 0.1517 0.2134 -- 98.0
X Ray Diffraction 6.0085 30.0 -- 164 5280 0.1285 0.1652 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.01
f_angle_d 1.411
f_chiral_restr 0.066
f_dihedral_angle_d 18.054
f_plane_restr 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14484
Nucleic Acid Atoms 0
Heterogen Atoms 348
Solvent Atoms 177

Software

Software
Software Name Purpose
PHENIX refinement version: dev_1951
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing