X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6
Temperature 293.15
Details 15% PEG-3350, 2% tacsimate, 5% isopropanol, 0.1 M imidazole pH 6

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 57.81 α = 90
b = 87.99 β = 90
c = 113.96 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2014-06-12
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.987 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.82 50 99.2 -- -- -- 4.1 -- 53467 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.82 29.862 -- 1.34 -- 52950 1999 99.38 -- 0.1749 0.1735 0.2094 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.82 1.8605 -- 130 3295 0.2062 0.2761 -- 92.0
X Ray Diffraction 1.8605 1.9108 -- 142 3627 0.2038 0.2567 -- 100.0
X Ray Diffraction 1.9108 1.967 -- 140 3578 0.2042 0.2539 -- 100.0
X Ray Diffraction 1.967 2.0305 -- 144 3642 0.1826 0.2139 -- 100.0
X Ray Diffraction 2.0305 2.1031 -- 141 3609 0.1842 0.2158 -- 100.0
X Ray Diffraction 2.1031 2.1872 -- 142 3621 0.1787 0.231 -- 100.0
X Ray Diffraction 2.1872 2.2867 -- 143 3656 0.1855 0.237 -- 100.0
X Ray Diffraction 2.2867 2.4073 -- 142 3617 0.1829 0.2284 -- 100.0
X Ray Diffraction 2.4073 2.558 -- 143 3644 0.1906 0.2409 -- 100.0
X Ray Diffraction 2.558 2.7554 -- 144 3683 0.1875 0.2346 -- 100.0
X Ray Diffraction 2.7554 3.0324 -- 144 3668 0.1828 0.2277 -- 100.0
X Ray Diffraction 3.0324 3.4707 -- 144 3677 0.1765 0.2024 -- 100.0
X Ray Diffraction 3.4707 4.3705 -- 147 3745 0.152 0.1738 -- 100.0
X Ray Diffraction 4.3705 29.8658 -- 153 3889 0.148 0.1726 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_bond_d 0.007
f_chiral_restr 0.045
f_angle_d 1.098
f_dihedral_angle_d 13.926
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4650
Nucleic Acid Atoms 0
Heterogen Atoms 86
Solvent Atoms 460

Software

Software
Software Name Purpose
PHENIX refinement version: (phenix.refine: 1.9_1692)
HKL-2000 data reduction
HKL-2000 data scaling