X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 277.0
Details 0.2M magnesium formate, 20% polyethylene glycol 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 37.43 α = 90
b = 49.42 β = 90
c = 82.9 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD Vertical focusing mirror; double crystal Si(111) monochromator 2014-12-06
Diffraction Radiation
Monochromator Protocol
double crystal Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL14-1 0.97952 SSRL BL14-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 23.68 98.3 0.03 -- -- 6.17 -- 30788 -- -3.0 19.725
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.4 1.45 96.6 0.946 -- 1.4 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.4 23.679 -- 0.0 -- 30733 1546 99.0 -- 0.1839 0.1827 0.2048 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 1.436 -- 117 2045 0.356 0.378 -- 95.83
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 26.8077
Anisotropic B[1][1] 2.27
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.55
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.73
RMS Deviations
Key Refinement Restraint Deviation
r_gen_planes_other 0.001
r_dihedral_angle_1_deg 5.883
r_gen_planes_refined 0.008
r_dihedral_angle_4_deg 15.752
r_mcbond_other 1.665
r_chiral_restr 0.113
r_angle_other_deg 1.015
r_bond_other_d 0.002
r_dihedral_angle_2_deg 35.803
r_angle_refined_deg 1.785
r_dihedral_angle_3_deg 12.982
r_bond_refined_d 0.02
r_mcangle_it 2.735
r_mcbond_it 1.673
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1142
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 186

Software

Software
Software Name Purpose
PDB_EXTRACT data extraction version: 3.10
SHELX phasing
SHARP phasing
XDS data scaling version: November 3, 2014 BUILT=20141118
REFMAC refinement version: 5.8.0103
XSCALE data scaling
SHELXD phasing