X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.6
Temperature 290.0
Details 0.1 M ammonium acetate, 0.1 M sodium acetate, 24-30% PEG 4000, crystals obtained by streak-seeding

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 45.31 α = 90
b = 73.13 β = 109.62
c = 52.84 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2013-07-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.28 41.15 99.5 -- 0.045 -- 3.7 -- 83422 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.28 1.36 98.2 0.427 -- 3.0 3.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.278 36.564 -- 1.38 -- 83418 4171 99.58 -- 0.117 0.1159 0.139 random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.2784 1.293 -- 131 2490 0.1742 0.1954 -- 93.0
X Ray Diffraction 1.293 1.3082 -- 138 2613 0.1723 0.2135 -- 100.0
X Ray Diffraction 1.3082 1.3241 -- 141 2665 0.1548 0.1684 -- 100.0
X Ray Diffraction 1.3241 1.3409 -- 138 2616 0.154 0.1964 -- 100.0
X Ray Diffraction 1.3409 1.3586 -- 138 2619 0.1472 0.17 -- 100.0
X Ray Diffraction 1.3586 1.3772 -- 139 2647 0.144 0.1668 -- 100.0
X Ray Diffraction 1.3772 1.3968 -- 139 2632 0.1286 0.1826 -- 100.0
X Ray Diffraction 1.3968 1.4177 -- 138 2641 0.1186 0.1632 -- 100.0
X Ray Diffraction 1.4177 1.4398 -- 138 2630 0.1101 0.1416 -- 100.0
X Ray Diffraction 1.4398 1.4634 -- 140 2665 0.1064 0.1593 -- 100.0
X Ray Diffraction 1.4634 1.4887 -- 139 2620 0.1046 0.1384 -- 100.0
X Ray Diffraction 1.4887 1.5158 -- 140 2654 0.1045 0.1487 -- 100.0
X Ray Diffraction 1.5158 1.5449 -- 138 2625 0.0958 0.1479 -- 100.0
X Ray Diffraction 1.5449 1.5764 -- 139 2650 0.0877 0.1303 -- 100.0
X Ray Diffraction 1.5764 1.6107 -- 139 2636 0.0856 0.1289 -- 100.0
X Ray Diffraction 1.6107 1.6482 -- 139 2627 0.0867 0.1236 -- 100.0
X Ray Diffraction 1.6482 1.6894 -- 140 2662 0.0858 0.1349 -- 100.0
X Ray Diffraction 1.6894 1.7351 -- 139 2649 0.0889 0.1334 -- 100.0
X Ray Diffraction 1.7351 1.7861 -- 138 2638 0.0876 0.1183 -- 100.0
X Ray Diffraction 1.7861 1.8438 -- 139 2645 0.0912 0.1193 -- 100.0
X Ray Diffraction 1.8438 1.9097 -- 140 2658 0.0898 0.11 -- 100.0
X Ray Diffraction 1.9097 1.9861 -- 139 2625 0.0904 0.12 -- 100.0
X Ray Diffraction 1.9861 2.0765 -- 140 2665 0.0916 0.1041 -- 100.0
X Ray Diffraction 2.0765 2.186 -- 140 2648 0.0917 0.129 -- 100.0
X Ray Diffraction 2.186 2.3229 -- 139 2647 0.1046 0.1231 -- 100.0
X Ray Diffraction 2.3229 2.5022 -- 140 2664 0.1118 0.1381 -- 100.0
X Ray Diffraction 2.5022 2.754 -- 139 2649 0.1204 0.1418 -- 100.0
X Ray Diffraction 2.754 3.1523 -- 142 2673 0.1269 0.1436 -- 100.0
X Ray Diffraction 3.1523 3.9708 -- 139 2671 0.1371 0.1346 -- 100.0
X Ray Diffraction 3.9708 36.5789 -- 143 2723 0.1528 0.1574 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.199
f_dihedral_angle_d 10.595
f_bond_d 0.006
f_chiral_restr 0.069
f_plane_restr 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2368
Nucleic Acid Atoms 0
Heterogen Atoms 27
Solvent Atoms 302

Software

Software
Software Name Purpose
PHENIX refinement version: 1.8.4_1492
XDS data reduction
XDS data scaling
Coot model building