X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 293.0
Details 0.1 M MES, pH 7.0, 15% PEG20000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.68 α = 90
b = 63.68 β = 90
c = 170.37 γ = 90
Symmetry
Space Group P 41 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2011-03-31
Diffraction Radiation
Monochromator Protocol
double crystal Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 1.0246 SSRL BL12-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.79 27.01 99.7 0.059 -- -- 4.1 -- 34205 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.79 1.85 99.2 0.386 -- 4.1 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.79 27.009 -- 0.0 -- 33824 1992 99.14 -- 0.1826 0.1803 0.2193 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.788 1.8327 -- 136 2174 0.2321 0.2398 -- 96.0
X Ray Diffraction 1.8327 1.8823 -- 140 2212 0.2336 0.2879 -- 98.0
X Ray Diffraction 1.8823 1.9377 -- 138 2185 0.2177 0.2779 -- 98.0
X Ray Diffraction 1.9377 2.0002 -- 140 2239 0.2137 0.2787 -- 99.0
X Ray Diffraction 2.0002 2.0716 -- 141 2241 0.2106 0.2378 -- 99.0
X Ray Diffraction 2.0716 2.1546 -- 141 2245 0.1956 0.2306 -- 100.0
X Ray Diffraction 2.1546 2.2526 -- 140 2270 0.1885 0.2604 -- 100.0
X Ray Diffraction 2.2526 2.3713 -- 142 2263 0.1813 0.231 -- 100.0
X Ray Diffraction 2.3713 2.5197 -- 142 2269 0.1995 0.2308 -- 100.0
X Ray Diffraction 2.5197 2.7141 -- 142 2287 0.1999 0.2306 -- 100.0
X Ray Diffraction 2.7141 2.9869 -- 143 2299 0.1937 0.2377 -- 100.0
X Ray Diffraction 2.9869 3.4184 -- 145 2314 0.1824 0.2235 -- 100.0
X Ray Diffraction 3.4184 4.304 -- 147 2364 0.1501 0.1909 -- 100.0
X Ray Diffraction 4.304 27.0123 -- 155 2470 0.1611 0.1874 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 14.319
f_plane_restr 0.007
f_bond_d 0.012
f_angle_d 1.326
f_chiral_restr 0.056
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2381
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 306

Software

Software
Software Name Purpose
PHENIX refinement version: (phenix.refine: 1.8.4_1496)
HKL-2000 data scaling
PHASER phasing
Coot model building
HKL-2000 data reduction