X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 298.0
Details NaOAc, ammonium sulfate, PEG 5K MME, glycerol

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 138.92 α = 90
b = 88.12 β = 90.95
c = 101.04 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2014-07-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.31 41.18 99.47 -- -- -- 7.5 -- 53496 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.307 2.389 94.81 -- -- 1.5 6.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.307 41.177 -- 0.0 -- 50557 1871 94.01 -- 0.2113 0.2098 0.2506 Random selection
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3066 2.369 -- 106 2945 0.2802 0.3294 -- 74.0
X Ray Diffraction 2.369 2.4387 -- 127 3427 0.267 0.3269 -- 86.0
X Ray Diffraction 2.4387 2.5174 -- 125 3454 0.2583 0.3029 -- 87.0
X Ray Diffraction 2.5174 2.6074 -- 143 3612 0.258 0.3384 -- 92.0
X Ray Diffraction 2.6074 2.7117 -- 166 3777 0.2477 0.3023 -- 95.0
X Ray Diffraction 2.7117 2.8351 -- 138 3862 0.2339 0.2769 -- 97.0
X Ray Diffraction 2.8351 2.9846 -- 155 3870 0.2455 0.2798 -- 98.0
X Ray Diffraction 2.9846 3.1715 -- 158 3933 0.2337 0.3008 -- 99.0
X Ray Diffraction 3.1715 3.4163 -- 159 3963 0.2144 0.3026 -- 100.0
X Ray Diffraction 3.4163 3.7598 -- 136 3796 0.2261 0.264 -- 95.0
X Ray Diffraction 3.7598 4.3034 -- 144 3983 0.1867 0.193 -- 100.0
X Ray Diffraction 4.3034 5.4199 -- 155 4011 0.17 0.206 -- 100.0
X Ray Diffraction 5.4199 41.1839 -- 159 4053 0.2008 0.2348 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.029
f_plane_restr 0.003
f_angle_d 0.712
f_dihedral_angle_d 13.287
f_bond_d 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6074
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 165

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing version: (phenix.refine: dev_1664)