X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 292.0
Details PEG 3350, potassium nitrate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 76.09 α = 90
b = 181.24 β = 113.72
c = 94.43 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2014-03-26
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.0 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.36 45.64 98.0 -- 0.094 -- 2.5 -- 46583 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.36 2.47 99.3 0.489 -- 1.9 2.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.362 45.64 -- 1.36 -- 46583 2367 97.45 -- 0.2007 0.1983 0.2441 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3624 2.4106 -- 116 2245 0.2837 0.3637 -- 85.0
X Ray Diffraction 2.4106 2.463 -- 158 2621 0.274 0.3236 -- 99.0
X Ray Diffraction 2.463 2.5203 -- 143 2649 0.2532 0.3138 -- 99.0
X Ray Diffraction 2.5203 2.5833 -- 146 2618 0.2396 0.3029 -- 99.0
X Ray Diffraction 2.5833 2.6531 -- 139 2659 0.2384 0.2831 -- 99.0
X Ray Diffraction 2.6531 2.7312 -- 146 2638 0.2194 0.3087 -- 99.0
X Ray Diffraction 2.7312 2.8193 -- 136 2644 0.223 0.2849 -- 99.0
X Ray Diffraction 2.8193 2.9201 -- 122 2665 0.2233 0.2642 -- 99.0
X Ray Diffraction 2.9201 3.037 -- 152 2619 0.2237 0.3035 -- 99.0
X Ray Diffraction 3.037 3.1752 -- 144 2633 0.2189 0.2695 -- 98.0
X Ray Diffraction 3.1752 3.3425 -- 119 2630 0.217 0.302 -- 99.0
X Ray Diffraction 3.3425 3.5519 -- 122 2611 0.204 0.2352 -- 98.0
X Ray Diffraction 3.5519 3.826 -- 147 2608 0.1939 0.2251 -- 98.0
X Ray Diffraction 3.826 4.2108 -- 138 2594 0.1763 0.2276 -- 97.0
X Ray Diffraction 4.2108 4.8195 -- 131 2599 0.1507 0.2007 -- 97.0
X Ray Diffraction 4.8195 6.0698 -- 141 2591 0.1602 0.1807 -- 97.0
X Ray Diffraction 6.0698 45.6485 -- 167 2592 0.1772 0.2011 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.009
f_plane_restr 0.006
f_angle_d 1.212
f_dihedral_angle_d 14.129
f_chiral_restr 0.051
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8222
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 149

Software

Software
Software Name Purpose
PHENIX refinement version: (phenix.refine: 1.8.2_1309)
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing