X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 298.0
Details 60 MM BIS-TRIS METHANE, 40 MM CITRIC ACID, 20% PEG3350, 1.9% 1-PROPANOL, PH 7.6, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 80.38 α = 90
b = 94.98 β = 90
c = 62.78 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r MIRRORS 2012-07-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 -- SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.84 37.87 100.0 0.1 -- -- 5.2 -- 42473 -- -3.0 21.19
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.84 1.88 99.5 0.96 -- 1.1 4.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.841 37.874 -- 1.35 -- 33032 1691 77.94 -- 0.1652 0.163 0.2079 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8406 1.8948 -- 42 687 0.2057 0.2431 -- 21.0
X Ray Diffraction 1.8948 1.956 -- 75 1239 0.1914 0.2655 -- 38.0
X Ray Diffraction 1.956 2.0259 -- 96 1674 0.1961 0.234 -- 51.0
X Ray Diffraction 2.0259 2.107 -- 96 2087 0.1924 0.2421 -- 63.0
X Ray Diffraction 2.107 2.2029 -- 112 2465 0.1958 0.2485 -- 74.0
X Ray Diffraction 2.2029 2.319 -- 175 2898 0.1869 0.2228 -- 87.0
X Ray Diffraction 2.319 2.4643 -- 197 3239 0.1922 0.2436 -- 99.0
X Ray Diffraction 2.4643 2.6545 -- 194 3327 0.1747 0.2463 -- 100.0
X Ray Diffraction 2.6545 2.9215 -- 163 3378 0.1769 0.246 -- 100.0
X Ray Diffraction 2.9215 3.344 -- 171 3378 0.1584 0.2036 -- 100.0
X Ray Diffraction 3.344 4.2123 -- 169 3432 0.135 0.1686 -- 100.0
X Ray Diffraction 4.2123 37.8824 -- 201 3537 0.1461 0.1765 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.242
f_dihedral_angle_d 14.628
f_bond_d 0.007
f_chiral_restr 0.075
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2941
Nucleic Acid Atoms 0
Heterogen Atoms 80
Solvent Atoms 331

Software

Software
Software Name Purpose
PHENIX refinement version: (PHENIX.REFINE)
MOSFLM data reduction
Aimless data scaling