X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 291.0
Details PEG 4000

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 42.11 α = 79.27
b = 63.23 β = 89.27
c = 73.99 γ = 90.29
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2014-01-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.987 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.26 50 97.3 -- -- -- 3.5 -- 34648 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.26 43.398 -- 1.96 -- 34000 1786 96.79 -- 0.1992 0.1971 0.2358 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.26 2.3211 -- 126 2289 0.3323 0.3702 -- 88.0
X Ray Diffraction 2.3211 2.3894 -- 136 2446 0.2813 0.3043 -- 96.0
X Ray Diffraction 2.3894 2.4665 -- 143 2502 0.2528 0.2856 -- 97.0
X Ray Diffraction 2.4665 2.5547 -- 137 2423 0.2576 0.3212 -- 96.0
X Ray Diffraction 2.5547 2.6569 -- 135 2520 0.2297 0.2702 -- 98.0
X Ray Diffraction 2.6569 2.7778 -- 141 2490 0.2171 0.2863 -- 98.0
X Ray Diffraction 2.7778 2.9243 -- 138 2510 0.2125 0.2475 -- 98.0
X Ray Diffraction 2.9243 3.1074 -- 133 2505 0.211 0.2825 -- 98.0
X Ray Diffraction 3.1074 3.3473 -- 142 2515 0.2032 0.259 -- 98.0
X Ray Diffraction 3.3473 3.684 -- 130 2523 0.1807 0.233 -- 98.0
X Ray Diffraction 3.684 4.2167 -- 148 2535 0.1711 0.186 -- 98.0
X Ray Diffraction 4.2167 5.311 -- 140 2475 0.1618 0.1958 -- 98.0
X Ray Diffraction 5.311 43.4061 -- 137 2481 0.1632 0.1876 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 17.432
f_bond_d 0.009
f_angle_d 1.273
f_plane_restr 0.007
f_chiral_restr 0.049
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers

Software

Software
Software Name Purpose
PHENIX refinement version: (phenix.refine: 1.8.4_1496)