X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 289.0
Details 10% glycerol, 0.1 M MES pH 6.0, 30% PEG 600, 5% (w/v) PEG 1000.

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.6 α = 90
b = 62.68 β = 109.39
c = 35.81 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2011-08-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.54 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 33.78 97.7 0.026 -- -- 15.5 -- 15984 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.65 1.69 94.9 0.148 -- 19.1 15.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.651 33.78 -- 1.84 -- 15966 798 97.65 -- 0.1675 0.1662 0.1902 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6512 1.7045 -- 130 2645 0.198 0.2479 -- 95.0
X Ray Diffraction 1.7045 1.7654 -- 153 2630 0.1809 0.227 -- 96.0
X Ray Diffraction 1.7654 1.836 -- 135 2648 0.1742 0.2022 -- 96.0
X Ray Diffraction 1.836 1.9196 -- 157 2683 0.1638 0.2441 -- 97.0
X Ray Diffraction 1.9196 2.0208 -- 146 2701 0.1559 0.208 -- 97.0
X Ray Diffraction 2.0208 2.1474 -- 155 2711 0.1553 0.1734 -- 98.0
X Ray Diffraction 2.1474 2.3131 -- 125 2742 0.163 0.1842 -- 98.0
X Ray Diffraction 2.3131 2.5459 -- 118 2758 0.173 0.2148 -- 99.0
X Ray Diffraction 2.5459 2.9141 -- 140 2739 0.1824 0.1913 -- 99.0
X Ray Diffraction 2.9141 3.6707 -- 147 2781 0.1643 0.1863 -- 100.0
X Ray Diffraction 3.6707 33.7859 -- 164 2755 0.1564 0.1603 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.352
f_bond_d 0.007
f_dihedral_angle_d 11.56
f_chiral_restr 0.061
f_plane_restr 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers

Software

Software
Software Name Purpose
PHENIX refinement version: (phenix.refine: 1.8.4_1496)
XDS data scaling