X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 295.0
Details 0.2 M sodium chloride, 0.1M Na/K phosphate, and 25% w/v polyethylene glycol 1000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.22 α = 90
b = 183.19 β = 100.62
c = 81.28 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M-F -- 2013-06-14
Diffraction Radiation
Monochromator Protocol
cryocooled channel-cut SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-1A 1.10 Photon Factory BL-1A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 50 96.8 0.083 -- -- 5.9 67543 65382 1.5 1.5 55.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.64 93.0 0.57 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 50.0 1.0 1.0 64697 62523 3257 96.64 -- 0.18508 0.18317 0.22203 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.667 -- 225 4328 0.275 0.301 -- 90.97
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 65.699
Anisotropic B[1][1] -0.98
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.39
Anisotropic B[2][2] -5.16
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 5.6
RMS Deviations
Key Refinement Restraint Deviation
r_mcbond_it 3.613
r_scbond_other 3.856
r_long_range_B_refined 9.204
r_long_range_B_other 9.201
r_dihedral_angle_3_deg 17.082
r_dihedral_angle_4_deg 15.45
r_dihedral_angle_2_deg 36.696
r_mcangle_it 5.901
r_bond_refined_d 0.008
r_bond_other_d 0.005
r_chiral_restr 0.068
r_mcbond_other 3.611
r_gen_planes_refined 0.005
r_angle_refined_deg 1.259
r_scangle_other 6.447
r_gen_planes_other 0.004
r_mcangle_other 5.901
r_dihedral_angle_1_deg 5.209
r_scbond_it 3.868
r_angle_other_deg 1.092
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14493
Nucleic Acid Atoms 0
Heterogen Atoms 152
Solvent Atoms 332

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASES phasing
REFMAC refinement version: 5.8.0073
HKL-2000 data reduction
HKL-2000 data scaling