X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 293.0
Details 0.1M Tris-HCl, 21% PEG 8000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 57.96 α = 90
b = 67.5 β = 90
c = 69.62 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2012-09-15
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSRRC BEAMLINE BL13B1 1.0000 NSRRC BL13B1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 30 99.8 0.06 -- -- 7.6 36684 36684 0.0 0.0 14.7
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.66 99.6 0.36 -- 4.8 7.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 24.872 -- 1.35 36684 36624 1830 99.76 0.1752 0.1752 0.1738 0.2035 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6003 1.6435 -- 125 2664 0.2198 0.2619 -- 99.0
X Ray Diffraction 1.6435 1.6919 -- 128 2630 0.1983 0.2163 -- 100.0
X Ray Diffraction 1.6919 1.7465 -- 139 2646 0.1906 0.2248 -- 100.0
X Ray Diffraction 1.7465 1.8089 -- 140 2637 0.1804 0.2379 -- 100.0
X Ray Diffraction 1.8089 1.8813 -- 153 2633 0.1743 0.2281 -- 100.0
X Ray Diffraction 1.8813 1.9669 -- 156 2619 0.1776 0.2315 -- 100.0
X Ray Diffraction 1.9669 2.0705 -- 136 2668 0.1815 0.2325 -- 100.0
X Ray Diffraction 2.0705 2.2002 -- 133 2669 0.1753 0.1998 -- 100.0
X Ray Diffraction 2.2002 2.3699 -- 144 2660 0.1754 0.2121 -- 100.0
X Ray Diffraction 2.3699 2.6082 -- 145 2695 0.1727 0.208 -- 100.0
X Ray Diffraction 2.6082 2.9851 -- 135 2691 0.1797 0.2153 -- 100.0
X Ray Diffraction 2.9851 3.7588 -- 154 2725 0.1681 0.1866 -- 100.0
X Ray Diffraction 3.7588 24.8745 -- 142 2857 0.1574 0.1657 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.055
f_dihedral_angle_d 13.953
f_bond_d 0.012
f_plane_restr 0.007
f_angle_d 1.423
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2285
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 258

Software

Software
Software Name Purpose
Blu-Ice data collection version: GUI
PHASES phasing
PHENIX refinement version: (phenix.refine: 1.8.4_1496)
HKL-2000 data reduction
HKL-2000 data scaling