X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.8
Temperature 298.0
Details 1.6 M Sodium Citrate, 50mM Tris-HCl, pH 7.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 42.38 α = 90
b = 41.4 β = 104.36
c = 72.3 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 19.86 96.6 -- 0.06 -- 2.5 -- 37836 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.55 96.5 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.5 19.85 -- 1.34 -- 36563 1908 96.5 -- 0.16 0.158 0.186 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.5372 -- 133 2516 0.272 0.2756 -- 95.0
X Ray Diffraction 1.5372 1.5788 -- 136 2580 0.2221 0.2247 -- 97.0
X Ray Diffraction 1.5788 1.6252 -- 138 2555 0.1832 0.2377 -- 97.0
X Ray Diffraction 1.6252 1.6777 -- 134 2566 0.1681 0.1982 -- 98.0
X Ray Diffraction 1.6777 1.7376 -- 149 2589 0.1578 0.1715 -- 98.0
X Ray Diffraction 1.7376 1.8071 -- 131 2613 0.1587 0.1952 -- 98.0
X Ray Diffraction 1.8071 1.8893 -- 140 2600 0.1591 0.1932 -- 99.0
X Ray Diffraction 1.8893 1.9888 -- 142 2604 0.1604 0.2049 -- 99.0
X Ray Diffraction 1.9888 2.1133 -- 134 2622 0.1523 0.2081 -- 98.0
X Ray Diffraction 2.1133 2.2762 -- 133 2583 0.1554 0.1974 -- 98.0
X Ray Diffraction 2.2762 2.5049 -- 138 2591 0.17 0.1843 -- 97.0
X Ray Diffraction 2.5049 2.8664 -- 137 2569 0.1622 0.1977 -- 96.0
X Ray Diffraction 2.8664 3.6079 -- 135 2513 0.1549 0.179 -- 94.0
X Ray Diffraction 3.6079 19.8552 -- 128 2427 0.141 0.1566 -- 88.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_dihedral_angle_d 13.547
f_chiral_restr 0.047
f_angle_d 1.204
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2073
Nucleic Acid Atoms 0
Heterogen Atoms 31
Solvent Atoms 220

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.9_1692)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing