X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.8
Temperature 298.0
Details 1.6 M Sodium Citrate, 50mM Tris-HCl, pH 7.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 41.95 α = 90
b = 41.22 β = 103.84
c = 71.95 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.64 19.9 92.5 -- 0.07 -- 4.3 -- 35999 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.64 1.68 87.2 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.65 19.88 -- 1.34 -- 25331 1266 87.0 -- 0.159 0.157 0.205 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.65 1.6919 -- 91 1736 0.2817 0.3444 -- 42.0
X Ray Diffraction 1.6919 1.7417 -- 93 1855 0.2392 0.2724 -- 45.0
X Ray Diffraction 1.7417 1.7978 -- 94 1889 0.2186 0.3014 -- 46.0
X Ray Diffraction 1.7978 1.8621 -- 100 1880 0.2141 0.2418 -- 46.0
X Ray Diffraction 1.8621 1.9366 -- 104 1932 0.1907 0.2638 -- 47.0
X Ray Diffraction 1.9366 2.0246 -- 109 1998 0.1766 0.2312 -- 48.0
X Ray Diffraction 2.0246 2.1312 -- 108 2066 0.166 0.2147 -- 50.0
X Ray Diffraction 2.1312 2.2646 -- 125 2415 0.1569 0.1664 -- 58.0
X Ray Diffraction 2.2646 2.4392 -- 175 3062 0.151 0.2067 -- 74.0
X Ray Diffraction 2.4392 2.6841 -- 189 3628 0.16 0.2302 -- 88.0
X Ray Diffraction 2.6841 3.0712 -- 204 3903 0.1628 0.1957 -- 94.0
X Ray Diffraction 3.0712 3.8648 -- 203 3892 0.1389 0.1945 -- 94.0
X Ray Diffraction 3.8648 19.8796 -- 205 3943 0.13 0.1745 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.007
f_chiral_restr 0.044
f_dihedral_angle_d 14.28
f_angle_d 1.096
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2052
Nucleic Acid Atoms 0
Heterogen Atoms 32
Solvent Atoms 206

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.9_1692)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing