X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 294.0
Details 100 MM MES, 200 MM CALCIUM ACETATE, 20% PEG 8000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.09 α = 90
b = 53.54 β = 90
c = 54 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 2013-01-17
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.97872 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 31.13 99.67 -- 0.041 -- 5.9 -- 22388 0.0 0.0 22.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.4 1.4629 98.21 -- 0.402 5.59 5.9 2184

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.4 31.127 -- 1.36 -- 22341 1145 99.67 -- 0.1671 0.1658 0.1907 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 1.4629 -- 136 2579 0.2013 0.2171 -- 99.0
X Ray Diffraction 1.4629 1.5401 -- 130 2615 0.1912 0.208 -- 100.0
X Ray Diffraction 1.5401 1.6365 -- 144 2618 0.182 0.2142 -- 100.0
X Ray Diffraction 1.6365 1.7629 -- 147 2619 0.1775 0.2413 -- 100.0
X Ray Diffraction 1.7629 1.9403 -- 150 2644 0.1617 0.2084 -- 100.0
X Ray Diffraction 1.9403 2.221 -- 145 2647 0.1504 0.168 -- 100.0
X Ray Diffraction 2.221 2.7979 -- 136 2694 0.1594 0.2176 -- 100.0
X Ray Diffraction 2.7979 31.1342 -- 157 2780 0.166 0.1705 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 19.137
f_chiral_restr 0.085
f_bond_d 0.012
f_angle_d 1.556
f_plane_restr 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 933
Nucleic Acid Atoms 0
Heterogen Atoms 42
Solvent Atoms 101

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building version: (phenix.refine: 1.9_1692)
PHENIX refinement version: (phenix.refine: 1.9_1692)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing version: 1.9_1692