X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.8
Temperature 293.0
Details 20 MM MGAC2, 13% MPD, PH 6.8, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 134.76 α = 90
b = 301.27 β = 112.81
c = 144.42 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2013-08-14
Diffraction Radiation
Monochromator Protocol
LN2 COOLED FIXED-EXIT. SI(111) MONOCHROMATOR SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.0 SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 30 98.9 0.076 -- -- -- 289794 286607 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.8 99.4 0.553 -- 2.7 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7 15.0 -- -- 286607 272276 14331 99.0 -- 0.19085 0.18966 0.21338 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.768 -- 1032 19606 0.322 0.345 -- 99.51
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 61.353
Anisotropic B[1][1] 2.21
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.73
Anisotropic B[2][2] -6.31
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.26
RMS Deviations
Key Refinement Restraint Deviation
r_mcangle_other 2.9
r_mcangle_it 2.9
r_dihedral_angle_1_deg 4.979
r_long_range_B_other 3.275
r_long_range_B_refined 3.297
r_gen_planes_other 0.001
r_angle_other_deg 0.672
r_dihedral_angle_2_deg 33.851
r_dihedral_angle_4_deg 12.732
r_bond_refined_d 0.004
r_gen_planes_refined 0.002
r_dihedral_angle_3_deg 13.613
r_scangle_other 2.549
r_scbond_it 2.08
r_rigid_bond_restr 1.01
r_bond_other_d 0.001
r_sphericity_free 28.619
r_angle_refined_deg 0.83
r_sphericity_bonded 15.995
r_mcbond_it 2.185
r_mcbond_other 2.185
r_scbond_other 2.08
r_chiral_restr 0.048
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 49364
Nucleic Acid Atoms 0
Heterogen Atoms 11
Solvent Atoms 474

Software

Software
Software Name Purpose
XDS data scaling
REFMAC refinement
XDS data reduction
XSCALE data scaling
REFMAC phasing