X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 291.0
Details pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 75.47 α = 90
b = 53.73 β = 94.55
c = 85.21 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2012-12-16
Diffraction Radiation
Monochromator Protocol
Channel cut cryogenically cooled monochromator crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9801 SOLEIL PROXIMA 1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.12 50 94.7 -- -- -- -- -- 38373 0.0 0.0 37.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.33 94.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.124 38.307 -- 1.99 -- 38373 1917 98.91 -- 0.1806 0.178 0.2286 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1235 2.1766 -- 123 2338 0.2606 0.3334 -- 90.0
X Ray Diffraction 2.1766 2.2355 -- 139 2635 0.2518 0.3302 -- 100.0
X Ray Diffraction 2.2355 2.3012 -- 131 2526 0.2613 0.3125 -- 98.0
X Ray Diffraction 2.3012 2.3755 -- 139 2637 0.2123 0.2764 -- 100.0
X Ray Diffraction 2.3755 2.4604 -- 137 2597 0.1977 0.2915 -- 100.0
X Ray Diffraction 2.4604 2.5589 -- 138 2624 0.1986 0.2623 -- 100.0
X Ray Diffraction 2.5589 2.6753 -- 136 2594 0.1935 0.23 -- 100.0
X Ray Diffraction 2.6753 2.8163 -- 140 2646 0.1938 0.2714 -- 100.0
X Ray Diffraction 2.8163 2.9927 -- 137 2612 0.1907 0.2906 -- 100.0
X Ray Diffraction 2.9927 3.2237 -- 138 2613 0.1954 0.2225 -- 100.0
X Ray Diffraction 3.2237 3.5479 -- 138 2640 0.1818 0.1954 -- 99.0
X Ray Diffraction 3.5479 4.0608 -- 139 2624 0.1577 0.2019 -- 99.0
X Ray Diffraction 4.0608 5.1142 -- 140 2658 0.1415 0.199 -- 100.0
X Ray Diffraction 5.1142 38.3136 -- 142 2712 0.1578 0.1971 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 44.88
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_bond_d 0.008
f_angle_d 1.11
f_chiral_restr 0.046
f_dihedral_angle_d 15.53
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4946
Nucleic Acid Atoms 0
Heterogen Atoms 132
Solvent Atoms 173

Software

Software
Software Name Purpose
XDS data scaling
SHARP phasing
PHENIX refinement version: (phenix.refine: 1.8.4_1496)
XDS data reduction
XSCALE data scaling