X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 289.0
Details 2 M ammonium sulfate, 0.1 M Bis-Tris, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 223.76 α = 90
b = 223.76 β = 90
c = 57.88 γ = 120
Symmetry
Space Group H 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2013-09-14
Diffraction Radiation
Monochromator Protocol
double crystal Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 32.3 99.8 0.048 -- -- 3.3 142458 142174 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.63 99.6 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 32.297 -- 1.68 -- 133975 5472 86.93 -- 0.155 0.1538 0.1782 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6 1.6184 -- 165 2840 0.2081 0.2229 -- 32.0
X Ray Diffraction 1.6184 1.6374 -- 159 3487 0.2208 0.2584 -- 38.0
X Ray Diffraction 1.6374 1.6574 -- 197 4164 0.2323 0.2499 -- 46.0
X Ray Diffraction 1.6574 1.6783 -- 238 4919 0.2202 0.2395 -- 55.0
X Ray Diffraction 1.6783 1.7004 -- 293 5643 0.2182 0.2639 -- 62.0
X Ray Diffraction 1.7004 1.7237 -- 328 6194 0.2171 0.2404 -- 69.0
X Ray Diffraction 1.7237 1.7483 -- 352 6746 0.216 0.2288 -- 74.0
X Ray Diffraction 1.7483 1.7744 -- 319 7130 0.2084 0.2356 -- 79.0
X Ray Diffraction 1.7744 1.8022 -- 358 7477 0.2046 0.2358 -- 83.0
X Ray Diffraction 1.8022 1.8317 -- 432 7824 0.1978 0.2382 -- 87.0
X Ray Diffraction 1.8317 1.8633 -- 403 8151 0.1914 0.2017 -- 89.0
X Ray Diffraction 1.8633 1.8972 -- 503 8241 0.1827 0.2077 -- 92.0
X Ray Diffraction 1.8972 1.9336 -- 471 8407 0.1769 0.2213 -- 93.0
X Ray Diffraction 1.9336 1.9731 -- 502 8402 0.169 0.2074 -- 95.0
X Ray Diffraction 1.9731 2.016 -- 494 8529 0.1655 0.1977 -- 95.0
X Ray Diffraction 2.016 2.0629 -- 479 8548 0.1528 0.186 -- 95.0
X Ray Diffraction 2.0629 2.1145 -- 427 8600 0.1492 0.1844 -- 96.0
X Ray Diffraction 2.1145 2.1716 -- 475 8588 0.1431 0.1697 -- 95.0
X Ray Diffraction 2.1716 2.2355 -- 420 8707 0.1425 0.165 -- 96.0
X Ray Diffraction 2.2355 2.3077 -- 452 8721 0.1359 0.1744 -- 97.0
X Ray Diffraction 2.3077 2.3901 -- 455 8665 0.1367 0.1781 -- 97.0
X Ray Diffraction 2.3901 2.4858 -- 459 8798 0.1346 0.1688 -- 97.0
X Ray Diffraction 2.4858 2.5989 -- 525 8807 0.1412 0.1577 -- 98.0
X Ray Diffraction 2.5989 2.7358 -- 472 8879 0.142 0.1772 -- 99.0
X Ray Diffraction 2.7358 2.9071 -- 460 8944 0.1534 0.1602 -- 99.0
X Ray Diffraction 2.9071 3.1314 -- 488 8986 0.156 0.1983 -- 100.0
X Ray Diffraction 3.1314 3.4462 -- 462 9018 0.1465 0.1763 -- 100.0
X Ray Diffraction 3.4462 3.9441 -- 476 8937 0.1268 0.1399 -- 99.0
X Ray Diffraction 3.9441 4.9663 -- 526 8922 0.1184 0.1302 -- 100.0
X Ray Diffraction 4.9663 32.3035 -- 405 9076 0.17 0.1883 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.055
f_plane_restr 0.008
f_dihedral_angle_d 14.066
f_angle_d 1.333
f_bond_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6850
Nucleic Acid Atoms 0
Heterogen Atoms 134
Solvent Atoms 979

Software

Software
Software Name Purpose
SBC-Collect data collection
MOLREP phasing
CCP4 model building
PHENIX refinement version: (phenix.refine: dev_1639)
HKL-3000 data reduction
HKL-3000 data scaling
CCP4 phasing