X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 289.0
Details BrabA.17333.a.B1.PS02033 at 20 mg/mL against MCSG-1 screen condition F2 0.2 M ammonium acetate, 0.1 M BisTris HCl pH 6.5, 25% PEG 3350 supplemented with 25% ethylene glycol as cryo-protectant, crystal tracking ID 254589f2, unique puck ID xrf9-6, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 47.69 α = 90
b = 92.06 β = 96.82
c = 86.41 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2014-04-30
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.12709 SSRL BL7-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 50 99.5 0.072 -- -- 3.7 74703 74295 -- -3.0 25.269
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.75 1.8 99.0 0.547 -- 2.32 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.75 50.0 -- 0.0 -- 74272 3688 99.47 -- 0.1574 0.1559 0.1851 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.795 -- 287 5165 0.234 0.256 -- 99.07
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.456
Anisotropic B[1][1] 0.02
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.03
Anisotropic B[2][2] -1.38
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.31
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_1_deg 5.716
r_gen_planes_other 0.003
r_dihedral_angle_3_deg 11.827
r_dihedral_angle_4_deg 17.349
r_angle_refined_deg 1.461
r_bond_other_d 0.001
r_mcangle_it 1.335
r_bond_refined_d 0.012
r_gen_planes_refined 0.008
r_angle_other_deg 0.811
r_dihedral_angle_2_deg 32.425
r_chiral_restr 0.086
r_mcbond_it 0.833
r_mcbond_other 0.824
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5660
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 714

Software

Software
Software Name Purpose
XSCALE data scaling
PHASER phasing version: 2.5.6
REFMAC refinement version: 5.8.0071
PDB_EXTRACT data extraction version: 3.14
XDS data reduction