X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 8
Temperature 293.0
Details 0.1M Tris-HCl, pH 8.0, 10% (w/v) PEG 3350, 10mM MgCl2, 0.02% Sodium Azide, Hanging drop vapor diffusion method, temperature 293.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 202.36 α = 90
b = 114.97 β = 110.03
c = 125.92 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-225 -- 2013-10-18
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON RRCAT INDUS-2 BEAMLINE PX-BL21 -- RRCAT INDUS-2 PX-BL21

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.5 39.65 86.6 0.148 -- -- 3.1 -- 29659 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.5 3.71 88.5 0.512 -- 2.3 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.5 38.167 -- 1.34 -- 29635 1488 86.29 -- 0.2417 0.2379 0.3147 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.5001 3.613 -- 114 2633 0.3008 0.4091 -- 89.0
X Ray Diffraction 3.613 3.742 -- 140 2607 0.2909 0.3782 -- 88.0
X Ray Diffraction 3.742 3.8917 -- 154 2576 0.2806 0.3537 -- 88.0
X Ray Diffraction 3.8917 4.0686 -- 127 2564 0.2619 0.3604 -- 87.0
X Ray Diffraction 4.0686 4.2828 -- 131 2594 0.2388 0.3035 -- 88.0
X Ray Diffraction 4.2828 4.5508 -- 147 2545 0.2182 0.299 -- 87.0
X Ray Diffraction 4.5508 4.9015 -- 141 2555 0.213 0.3035 -- 86.0
X Ray Diffraction 4.9015 5.3935 -- 135 2548 0.2218 0.2977 -- 86.0
X Ray Diffraction 5.3935 6.1711 -- 127 2537 0.2615 0.3654 -- 85.0
X Ray Diffraction 6.1711 7.7642 -- 149 2514 0.2507 0.2778 -- 84.0
X Ray Diffraction 7.7642 38.1691 -- 123 2474 0.1834 0.2504 -- 81.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.035
f_angle_d 1.019
f_dihedral_angle_d 15.638
f_bond_d 0.007
f_plane_restr 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 17132
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 0

Software

Software
Software Name Purpose
Aimless data scaling version: 0.1.27
PHASER phasing
PHENIX refinement version: 1.9_1692
PDB_EXTRACT data extraction version: 3.14
XDS data reduction