X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.5
Temperature 298.0
Details 100 MM SODIUM ACETATE TRIHYDRATE (PH 4.5), 200 MM (NH4)2SO4, 16-18% PEG 3350, AND 10% GLYCEROL, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.67 α = 90
b = 92.75 β = 91.39
c = 69.64 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r Mirrors 2014-01-01
Diffraction Radiation
Monochromator Protocol
Si(220) Asymmetric cut single crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 0.97 ALS 5.0.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 98.5 -- 0.07 -- 7.4 56819 56375 2.0 2.0 22.5
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.03 96.2 -- 0.5 2.63 6.5 2735

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.999 48.735 -- 1.39 56819 54876 1943 95.71 0.181 0.1804 0.1788 0.2218 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9992 2.0491 -- 108 3123 0.2175 0.2809 -- 79.0
X Ray Diffraction 2.0491 2.1046 -- 113 3432 0.2109 0.303 -- 86.0
X Ray Diffraction 2.1046 2.1665 -- 129 3547 0.2071 0.2618 -- 90.0
X Ray Diffraction 2.1665 2.2364 -- 132 3707 0.2062 0.2615 -- 94.0
X Ray Diffraction 2.2364 2.3163 -- 147 3804 0.1913 0.2302 -- 97.0
X Ray Diffraction 2.3163 2.4091 -- 138 3835 0.1933 0.2592 -- 98.0
X Ray Diffraction 2.4091 2.5187 -- 147 3887 0.194 0.254 -- 99.0
X Ray Diffraction 2.5187 2.6515 -- 148 3907 0.1882 0.2195 -- 99.0
X Ray Diffraction 2.6515 2.8176 -- 135 3902 0.1983 0.2702 -- 99.0
X Ray Diffraction 2.8176 3.0351 -- 158 3942 0.1977 0.2795 -- 99.0
X Ray Diffraction 3.0351 3.3405 -- 145 3921 0.1859 0.2304 -- 100.0
X Ray Diffraction 3.3405 3.8237 -- 152 3926 0.1565 0.1707 -- 100.0
X Ray Diffraction 3.8237 4.8168 -- 142 3974 0.1494 0.1921 -- 100.0
X Ray Diffraction 4.8168 48.7497 -- 149 4026 0.1605 0.1737 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.045
f_chiral_restr 0.048
f_bond_d 0.007
f_plane_restr 0.006
f_dihedral_angle_d 13.236
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6806
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 572

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.8.4_1496)
HKL-2000 data reduction
HKL-2000 data scaling