X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 0.2 M proline, 0.1 M HEPES pH 7.5, 10% PEG 3350, cryoprotected by supplementing with 30% glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 83.92 α = 90
b = 110.26 β = 90
c = 127.65 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2013-10-16
Diffraction Radiation
Monochromator Protocol
Dual silicon, K-B mirrors SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.97934 APS 23-ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.04 50 100.0 -- -- -- 7.4 75635 75619 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.04 2.08 100.0 -- -- 2.0 7.4 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.04 46.14 -- 1.35 71784 71772 1968 94.42 0.16 0.1597 0.1587 0.1982 thin shells
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0401 2.0911 -- 70 2481 0.2091 0.2846 -- 47.0
X Ray Diffraction 2.0911 2.1476 -- 116 4145 0.2072 0.2597 -- 80.0
X Ray Diffraction 2.1476 2.2108 -- 141 4961 0.1853 0.206 -- 94.0
X Ray Diffraction 2.2108 2.2822 -- 145 5168 0.1849 0.253 -- 99.0
X Ray Diffraction 2.2822 2.3637 -- 147 5232 0.17 0.2378 -- 100.0
X Ray Diffraction 2.3637 2.4584 -- 149 5243 0.1593 0.2296 -- 100.0
X Ray Diffraction 2.4584 2.5702 -- 147 5233 0.1585 0.2206 -- 100.0
X Ray Diffraction 2.5702 2.7057 -- 148 5259 0.1515 0.2088 -- 100.0
X Ray Diffraction 2.7057 2.8752 -- 148 5245 0.1545 0.1811 -- 100.0
X Ray Diffraction 2.8752 3.0972 -- 149 5275 0.1523 0.1767 -- 100.0
X Ray Diffraction 3.0972 3.4088 -- 150 5303 0.1488 0.2182 -- 100.0
X Ray Diffraction 3.4088 3.9018 -- 149 5307 0.1438 0.1781 -- 100.0
X Ray Diffraction 3.9018 4.915 -- 152 5394 0.1343 0.1653 -- 100.0
X Ray Diffraction 4.915 46.1514 -- 157 5558 0.1825 0.1902 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.082
f_bond_d 0.012
f_dihedral_angle_d 14.933
f_angle_d 1.363
f_plane_restr 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5248
Nucleic Acid Atoms 218
Heterogen Atoms 53
Solvent Atoms 610

Software

Software
Software Name Purpose
MAR345dtb data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.8_1069)
HKL-2000 data reduction
HKL-2000 data scaling