X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 294.0
Details 100 MM MES, 200 MM CALCIUM ACETATE, 20% PEG 8000, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 294K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 37.91 α = 90
b = 53.58 β = 90
c = 53.93 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2013-07-12
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.97872 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.2 50 99.6 0.046 -- -- -- 35133 34994 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.2 1.24 100.0 0.281 -- 6.13 5.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.2 30.949 -- 1.34 617013 34994 1759 99.78 -- 0.1641 0.1635 0.1763 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.2 1.2325 -- 138 2522 0.2018 0.2332 -- 100.0
X Ray Diffraction 1.2325 1.2687 -- 123 2538 0.1913 0.2734 -- 100.0
X Ray Diffraction 1.2687 1.3097 -- 112 2556 0.1806 0.1904 -- 100.0
X Ray Diffraction 1.3097 1.3565 -- 139 2497 0.1745 0.1928 -- 100.0
X Ray Diffraction 1.3565 1.4108 -- 130 2547 0.1814 0.1988 -- 100.0
X Ray Diffraction 1.4108 1.475 -- 147 2505 0.1669 0.1762 -- 100.0
X Ray Diffraction 1.475 1.5528 -- 141 2544 0.1694 0.176 -- 100.0
X Ray Diffraction 1.5528 1.65 -- 126 2572 0.1614 0.167 -- 100.0
X Ray Diffraction 1.65 1.7774 -- 138 2541 0.1556 0.1767 -- 100.0
X Ray Diffraction 1.7774 1.9563 -- 139 2549 0.1558 0.1531 -- 100.0
X Ray Diffraction 1.9563 2.2393 -- 143 2595 0.1463 0.1415 -- 100.0
X Ray Diffraction 2.2393 2.821 -- 139 2605 0.1629 0.1752 -- 100.0
X Ray Diffraction 2.821 30.9588 -- 144 2664 0.1629 0.1832 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.012
f_chiral_restr 0.113
f_angle_d 1.674
f_plane_restr 0.008
f_dihedral_angle_d 16.788
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 942
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 149

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building version: (phenix.refine: 1.8_1069)
PHENIX refinement version: (phenix.refine: 1.8_1069)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing version: 1.8_1069