X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 277.0
Details 25 % PEG 4000, 100 mM MES pH 6.5, 200 mM potassium iodide, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 44.58 α = 90
b = 85.55 β = 94.61
c = 58.92 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2013-07-26
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9393 ESRF ID14-4

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 48.39 99.9 -- -- -- -- -- 40857 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.9 100.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.8 44.48 -- 2.0 40857 38725 2041 99.77 0.20977 0.2087 0.2087 0.2307 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.847 -- 153 2819 0.287 0.293 -- 98.28
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.407
Anisotropic B[1][1] -0.24
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.76
Anisotropic B[2][2] -0.96
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.12
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_2_deg 36.573
r_gen_planes_refined 0.003
r_mcbond_it 0.476
r_long_range_B_other 2.866
r_dihedral_angle_1_deg 5.284
r_mcbond_other 0.476
r_dihedral_angle_4_deg 17.244
r_mcangle_other 0.89
r_scbond_other 0.368
r_long_range_B_refined 3.239
r_angle_other_deg 0.672
r_gen_planes_other 0.001
r_mcangle_it 0.89
r_scbond_it 0.369
r_dihedral_angle_3_deg 11.657
r_angle_refined_deg 0.946
r_bond_refined_d 0.004
r_chiral_restr 0.054
r_bond_other_d 0.003
r_scangle_other 0.672
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3008
Nucleic Acid Atoms 0
Heterogen Atoms 72
Solvent Atoms 279

Software

Software
Software Name Purpose
MxCuBE data collection
PHASER phasing
REFMAC refinement version: 5.7.0032
iMOSFLM data reduction
SCALA data scaling