X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 295.0
Details 25% PEG 1000; 0.2M Ammonium Acetate, 0.1M TRIS pH 8.0, VAPOR DIFFUSION, SITTING DROP, NANODROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 65.6 α = 90
b = 112.78 β = 94.12
c = 73.88 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M Rhodium-coated vertical and horizontal focusing mirrors; liquid-nitrogen cooled double crystal Si(111) monochromator 2012-01-26
PIXEL DECTRIS PILATUS 6M Rhodium-coated vertical and horizontal focusing mirrors; liquid-nitrogen cooled double crystal Si(111) monochromator 2012-01-26
Diffraction Radiation
Monochromator Protocol
double crystal Si(111) SINGLE WAVELENGTH
double crystal Si(111) SAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 1.0080 SSRL BL12-2
SYNCHROTRON SSRL BEAMLINE BL12-2 0.9795 SSRL BL12-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 47.27 97.8 0.057 -- -- 3.8 -- 105477 -- -3.0 26.669
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.75 1.8 97.7 0.797 -- 1.7 3.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS 1.75 47.271 -- 0.0 -- 105434 5254 97.83 -- 0.182 0.1807 0.2054 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.79 -- 383 7393 0.2411 0.2863 -- 97.83
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 33.927
Anisotropic B[1][1] 0.1644
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 2.5095
Anisotropic B[2][2] -4.2398
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 4.0754
RMS Deviations
Key Refinement Restraint Deviation
t_other_torsion 2.79
t_omega_torsion 3.14
t_bond_d 0.01
t_angle_deg 0.93
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.208
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7983
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 603

Software

Software
Software Name Purpose
MolProbity model building version: 3beta29
PDB_EXTRACT data extraction version: 3.10
SHELX phasing
SHARP phasing
XSCALE data scaling version: December 29, 2011
BUSTER-TNT refinement version: 2.10.0
XDS data reduction
SHELXD phasing
BUSTER refinement version: 2.10.0