X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Microbatch Crystallization Under Oil
pH 10
Temperature 277.0
Details 12% PEG 20000, 0.1M ammonium bromide, 0.1M CAPS, pH 10.0, Microbatch crystallization under oil, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.47 α = 90
b = 54.47 β = 90
c = 109.85 γ = 120
Symmetry
Space Group P 32

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2013-04-25
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97931 NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 50 99.6 0.082 -- -- 3.2 42628 42458 0.0 0.0 32.06
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.18 96.8 0.666 -- 1.3 2.1 4027

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.099 43.348 -- 1.05 -- 42280 2172 99.35 -- 0.216 0.214 0.249 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.099 2.145 -- 124 2363 0.338 0.349 -- 95.0
X Ray Diffraction 2.145 2.195 -- 127 2523 0.309 0.336 -- 99.0
X Ray Diffraction 2.195 2.25 -- 121 2444 0.358 0.326 -- 98.0
X Ray Diffraction 2.25 2.31 -- 152 2509 0.334 0.375 -- 99.0
X Ray Diffraction 2.31 2.378 -- 154 2536 0.244 0.269 -- 100.0
X Ray Diffraction 2.378 2.455 -- 150 2504 0.234 0.292 -- 100.0
X Ray Diffraction 2.455 2.543 -- 124 2506 0.23 0.274 -- 100.0
X Ray Diffraction 2.543 2.645 -- 128 2500 0.216 0.25 -- 100.0
X Ray Diffraction 2.645 2.765 -- 148 2558 0.214 0.238 -- 100.0
X Ray Diffraction 2.765 2.911 -- 114 2530 0.216 0.307 -- 100.0
X Ray Diffraction 2.911 3.093 -- 144 2502 0.238 0.288 -- 100.0
X Ray Diffraction 3.093 3.332 -- 132 2564 0.229 0.325 -- 100.0
X Ray Diffraction 3.332 3.667 -- 140 2490 0.211 0.266 -- 100.0
X Ray Diffraction 3.667 4.197 -- 130 2568 0.183 0.186 -- 100.0
X Ray Diffraction 4.197 5.287 -- 138 2502 0.151 0.167 -- 100.0
X Ray Diffraction 5.287 43.357 -- 146 2509 0.176 0.193 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 39.773
Anisotropic B[1][1] -1.372
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.372
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 2.743
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.006
f_plane_restr 0.006
f_angle_d 1.308
f_dihedral_angle_d 15.107
f_chiral_restr 0.09
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2202
Nucleic Acid Atoms 0
Heterogen Atoms 8
Solvent Atoms 162

Software

Software
Software Name Purpose
PHENIX refinement version: 1.7.2_869
PDB_EXTRACT data extraction version: 3.100
ADSC data collection version: Quantum
HKL-2000 data reduction
HKL-2000 data scaling
SHELXS phasing