X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 294.0
Details 100 MM MES, 200 MM CALCIUM ACETATE, 20% PEG 8000, PH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 294K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 37.97 α = 90
b = 53.53 β = 90
c = 54.05 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 2012-07-12
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.97872 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 50 99.9 0.108 -- -- 3.2 213065 42059 0.0 0.0 12.56
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.4 1.45 100.0 0.247 -- 6.61 5.9 2188

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.4 38.032 -- 1.38 22426 22385 1146 99.67 -- 0.1403 0.1387 0.1696 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4 1.46 -- 143 2558 0.1249 0.19 -- 98.0
X Ray Diffraction 1.4607 1.5377 -- 160 2589 0.1075 0.1758 -- 100.0
X Ray Diffraction 1.5377 1.634 -- 134 2645 0.1101 0.184 -- 100.0
X Ray Diffraction 1.634 1.7602 -- 124 2637 0.1158 0.1706 -- 100.0
X Ray Diffraction 1.7602 1.9373 -- 141 2662 0.1149 0.1593 -- 100.0
X Ray Diffraction 1.9373 2.2177 -- 157 2640 0.114 0.1502 -- 100.0
X Ray Diffraction 2.2177 2.7939 -- 149 2690 0.1516 0.1783 -- 100.0
X Ray Diffraction 2.7939 38.0459 -- 138 2818 0.1647 0.1713 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.304
f_chiral_restr 0.073
f_plane_restr 0.005
f_bond_d 0.007
f_dihedral_angle_d 17.652
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 941
Nucleic Acid Atoms 0
Heterogen Atoms 37
Solvent Atoms 102

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building version: (phenix.refine: 1.8.2_1309)
PHENIX refinement version: (phenix.refine: 1.8.2_1309)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing version: 1.8.2_1309