X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 293.0
Details 0.1M HEPES, 8% PEG 4000, 6.5% isopropanol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.64 α = 90
b = 65.27 β = 90
c = 259.15 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 2011-08-03
Diffraction Radiation
Monochromator Protocol
APS ID22 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.59 50 90.6 0.127 0.098 -- 6.8 30121 27290 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.59 2.63 68.9 0.727 -- -- 3.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.59 32.393 -- 0.0 29955 27223 1388 90.88 -- 0.1953 0.1916 0.263 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.586 2.6784 -- 112 2141 0.308 0.3628 -- 77.0
X Ray Diffraction 2.6784 2.7856 -- 131 2404 0.2904 0.3626 -- 86.0
X Ray Diffraction 2.7856 2.9123 -- 157 2415 0.2562 0.3461 -- 87.0
X Ray Diffraction 2.9123 3.0657 -- 112 2509 0.223 0.3011 -- 88.0
X Ray Diffraction 3.0657 3.2576 -- 142 2467 0.2243 0.3162 -- 87.0
X Ray Diffraction 3.2576 3.5089 -- 141 2502 0.2073 0.3114 -- 90.0
X Ray Diffraction 3.5089 3.8615 -- 129 2652 0.1943 0.2916 -- 93.0
X Ray Diffraction 3.8615 4.4191 -- 137 2821 0.1543 0.2261 -- 99.0
X Ray Diffraction 4.4191 5.563 -- 159 2895 0.1424 0.2015 -- 100.0
X Ray Diffraction 5.563 32.3958 -- 168 3029 0.1742 0.2142 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.7004
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.6834
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.983
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_bond_d 0.005
f_chiral_restr 0.049
f_dihedral_angle_d 15.956
f_angle_d 0.891
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5966
Nucleic Acid Atoms 0
Heterogen Atoms 205
Solvent Atoms 145

Software

Software
Software Name Purpose
SCALEPACK data scaling
PHASER phasing
PHENIX refinement version: dev_998
PDB_EXTRACT data extraction version: 3.11
MAR345 data collection
HKL-2000 data reduction