X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 297.0
Details 0.2M magnesium chloride, 0.1M Tris-HCl, 30%(v/v) PEG400, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 297K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 84.65 α = 90
b = 84.65 β = 90
c = 73.97 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2011-06-02
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97929 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 37 99.7 0.076 -- -- 7.5 21023 21023 0.0 -5.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.03 100.0 0.551 -- 3.1 7.6 1025

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.0 36.655 -- 0.0 20191 20191 1026 95.61 0.1963 0.1963 0.1947 0.2289 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.1042 -- 114 2416 0.2201 0.2926 -- 85.0
X Ray Diffraction 2.1042 2.236 -- 150 2607 0.1995 0.246 -- 93.0
X Ray Diffraction 2.236 2.4087 -- 166 2695 0.1908 0.2586 -- 96.0
X Ray Diffraction 2.4087 2.651 -- 152 2790 0.2047 0.2958 -- 98.0
X Ray Diffraction 2.651 3.0344 -- 162 2817 0.2059 0.253 -- 99.0
X Ray Diffraction 3.0344 3.8224 -- 139 2889 0.1849 0.22 -- 100.0
X Ray Diffraction 3.8224 36.6611 -- 143 2951 0.1924 0.1937 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 7.8247
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 7.8247
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -15.6493
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_dihedral_angle_d 16.024
f_chiral_restr 0.06
f_angle_d 0.961
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1897
Nucleic Acid Atoms 0
Heterogen Atoms 51
Solvent Atoms 58

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
ARP model building
WARP model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine: 1.7_650)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing